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IEEE Transactions on Pattern Analysis and Machine Intelligence
April 1984 (vol. 6 no. 4)
ISSN: 0162-8828
Table of Contents
Papers
Shunji Mori, Electrotechnical Laboratory, Sakura-mura, Niihari-gun, Ibaraki 305, Japan; Nippon-Schlumberger, Schinjiku-Daiichiseimei, Tokyo, Japan.
Kazuhiko Yamamoto, Electrotechnical Laboratory, Sakura-mura, Niihari-gun, Ibaraki 305, Japan.
Michio Yasuda, Hitachi Microcomputer Ltd., Josuihon-cho, Kodaira-city, Tokyo 187, Japan.
pp. 386-405
Qing Ren Wang, Department of Computer Science, Concordia University, Montreal, P. Q., Canada H3G 1M8.
Ching Y. Suen, Department of Computer Science, Concordia University, Montreal, P. Q., Canada H3G 1M8.
pp. 406-417
Ruud M. Bolle, Laboratory for Engineering Man/Machine Systems, Division of Engineering, Brown University, Providence, RI 02912.
David B. Cooper, Laboratory for Engineering Man/Machine Systems, Division of Engineering, Brown University, Providence, RI 02912.
pp. 418-429
Bruno Cernuschi-Frias, Facultad de Ingenieria, University of Buenos Aires, Buenos Aires, Argentina.
David B. Cooper, Laboratory for Engineering Man/Machine Systems, Division of Engineering, Brown University, Providence, RI 02912.
pp. 430-441
R. Nackman Lee, IBM Thomas J. Watson Research Center, Yorktown Heights, NY 10598.
pp. 442-450
Leo Dorst, Laboratorium voor Technische Natuurkunde, Technische Hogeschool Delft, Delft, The Netherlands.
Arnold W. M. Smeulders, Department of Applied Physics, Delft University of Technology, Delft, The Netherlands; Department of Pathology and Medical Informatics, Free University, Amsterdam, The Netherlands.
pp. 450-463
Narendra Ahuja, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign, Urbana, IL 61801.
Sowmitri Swamy, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign, Urbana, IL 61801; Department of Computer Science, Gould Research Center, Rolling Meadows, IL 60008.
pp. 463-475
Shi-Kuo Chang, Information Systems Laboratory, Illinois Institute of Technology, Chicago, IL 60616.
Shao-Hung Liu, Department of Electrical Engineering and Computer Science, University of California, Berkeley, CA 94720.
pp. 475-484
Margaret Chock, M.I.B. Chock, Santa Monica, CA 90403.
Alfonso F. Cardenas, Department of Computer Science, University of California, Los Angeles, CA 90024.
Allen Klinger, Department of Computer Science, University of California, Los Angeles, CA 90024.
pp. 484-492
Richard E. Cullingford, Department of Electrical Engineering and Computer Science, University of Connecticut, Storrs, CT 06268.
Michael J. Pazzani, MITRE Corporation, Bedford, MA 01730.
pp. 493-509
Paul W. Purdom, Department of Computer Science, Indiana University, Bloomington, IN 47405.
pp. 510-513
Y. F. Wang, Laboratory for Image and Signal Analysis, University of Texas at Austin, Austin, TX 78712.
M. J. Magee, University of Wyoming, Laramie, WY 82071.
pp. 513-518
Shmuel Peleg, Center for Automation Research, University of Maryland, College Park, MD 20742; Department of Computer Science, the Hebrew University of Jerusalem, 91904 Jerusalem, Israel.
Joseph Naor, Department of Computer Science, the Hebrew University of Jerusalem, 91904 Jerusalem, Israel.
Ralph Hartley, Center for Automation Research, University of Maryland, College Park, MD 20742.
David Avnir, Department of Organic Chemistry, the Hebrew University of Jerusalem, 91904 Jerusalem, Israel.
pp. 518-523
Charles Jerian, Department of Electrical and Computer Engineering, University of Michigan, Ann Arbor, MI 48109.
Ramesh Jain, Department of Electrical and Computer Engineering, University of Michigan, Ann Arbor, MI 48109.
pp. 523-530
Moshe J. Lasry, Departments of Electrical Engineering and Computer Science, Carnegie-Mellon University, Pittsburgh, PA 15213.
Richard M. Stern, Departments of Electrical Engineering and Computer Science, Carnegie-Mellon University, Pittsburgh, PA 15213.
pp. 530-535
M. J. Lahart, U.S. Naval Research Laboratory, Washington, DC 20375; National Institutes of Health, Bethesda, MD 20209.
pp. 535-542
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