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IEEE Transactions on Pattern Analysis and Machine Intelligence
June 1983 (vol. 5 no. 6)
ISSN: 0162-8828
Table of Contents
Papers
John F. Jarvis, Guest Editor, Head of the Robotics Systems Research Department of AT&T Bell Laboratories, Holmdel, NJ.
Joseph L. Mundy, Guest Editor, Adjunct Professor in the Department of Mathematical Science at RPI.
pp. 561-562
Bindinganavle R. Suresh, MEMBER, IEEE, Honeywell Systems and Research Center, 2600 Ridgway Parkway, Minneapolis, MN 55413.
Richard A. Fundakowski, Honeywell Systems and Research Center, 2600 Ridgway Parkway, Minneapolis, MN 55413.
Tod S. Levitt, MEMBER, IEEE, Honeywell Systems and Research Center, 2600 Ridgway Parkway, Minneapolis, MN 55413.
John E. Overland, Honeywell Systems and Research Center, 2600 Ridgway Parkway, Minneapolis, MN 55413.
pp. 563-572
Richard W. Conners, MEMBER, IEEE, Department of Electrical and Computer Engineering, Louisiana State University, Baton Rouge, LA 70803.
Charles W. Mcmillin, Southern Forest Experiment Station, USDA Forest Service, 2500 Shreveport Highway, Pineville, LA 71360.
Kingyao Lin, MEMBER, IEEE, Department of Electrical and Computer Engineering, Louisiana State University, Baton Rouge, LA 70803; Bell Laboratories, Murray Hill, NJ 07974.
Ramon E. Vasquez-Espinosa, STUDENT MEMBER, IEEE, Department of Electrical and Computer Engineering, Louisiana State University, Baton Rouge, LA 70803.
pp. 573-583
W. A. Perkins, Computer Science Department, General Motors Research Laboratories, Warren, MI 49090; Lockheed Palo Alto Research Laboratory, Palo Alto, CA 94304.
pp. 584-592
Chih-Shing Ho, Unimation, Inc., Shelter Rock Lane, Danbury, CT 06810; APPLICON, 32 Second Avenue, Burlington, MA 01803.
pp. 593-601
L. F. Pau, SENIOR MEMBER, IEEE, Centres de Recherche de Geneve, Battelle Memorial Institute, 1227 Carouge, Geneva, Switzerland.
pp. 602-608
Thomas C. Henderson, Department of Computer Science, University of Utah, Salt Lake City, UT 84112.
pp. 609-618
Michael L. Baird, Motors Research Laboratories, Warren, MI 48090; Artificial Intelligence Laboratory, Advanced Research and Development, Fairchild Camera and Instrument Corporation, 4001 Miranda Ave
pp. 618-621
Charles R. Dyer, Department of Computer Sciences, University of Wisconsin, Madison, WI 53706.
pp. 621-623
Yasuhiko Hara, Production Engineering Research Laboratory, Hitachi, Ltd., 292 Yoshida-cho, Totsuka-ku, Yokohama 244, Japan.
Nobuyuki Akiyama, Production Engineering Research Laboratory, Hitachi, Ltd., 292 Yoshida-cho, Totsuka-ku, Yokohama 244, Japan.
Koichi Karasaki, Kanagawa Works, Hitachi, Ltd., 1 Horiyamashita, Hatano-shi, Kanagawa 259-13, Japan.
pp. 623-630
Rajarshi Ray, Object Recognition Systems, Inc., Princeton, NJ 08540.
John Birk, Hewlett-Packard Company, Palo Alto, CA 93303.
Robert B. Kelley, Robotics Research Center, University of Rhode Island, Kingston, RI 02881.
pp. 631-645
T. F. Schatzki, Agricultural Research Service, Western Regional Research Center, Berkeley, CA 94710.
A. Grossman, Agricultural Research Service, Western Regional Research Center, Berkeley, CA 94710.
R. Young, Agricultural Research Service, Western Regional Research Center, Berkeley, CA 94710.
pp. 645-653
Dana H. Ballard, Department of Computer Science, University of Rochester, Rochester, NY 14627.
Daniel Sabbah, Department of Computer Science, University of Rochester, Rochester, NY 14627.
pp. 653-660
Jan Strackee, Laboratory of Medical Physics, University of Amsterdam, Amsterdam, The Netherlands.
Nico J. D. Nagelkerke, Laboratory of Medical Physics, University of Amsterdam, Amsterdam, The Netherlands.
pp. 660-661
M. A. G. Mattoso Maia, Electronics Laboratories, University of Kent at Canterbury, Kent CT2 7NT, England.
M. C. Fairhurst, Electronics Laboratories, University of Kent at Canterbury, Kent CT2 7NT, England.
pp. 661-664
H. M. Kalayeh, Object Recognition Systems, Inc., Princeton, NJ 08540.
D. A. Landgrebe, Engineering Experiment Station, Purdue University, West Lafayette, IN 47906.
pp. 664-667
R. L. Kashyap, School of Electrical Engineering, Purdue University, West Lafayette, IN 47907.
B. J. Oommen, School of Computer Science, Carleton University, Ottawa, Ont., Canada K1S 5B6.
pp. 667-671
K. Fukunaga, Department of Electrical Engineering, Purdue University, West Lafayette, IN 47907.
J. M. Mantock, Department of Electrical Engineering, Purdue University, West Lafayette, IN 47907; Aerospace Corporation, Los Angeles, CA 90009; Texas Instruments, Inc., Lewisville, TX 75067.
pp. 671-678
W. H. H. J. Lunscher, Departrment of Electrical Engineering, University of British Columbia, Vancouver, B.C., Canada V6T 1Z2.
pp. 678-680
Index Edics (PDF)
pp. 681-688
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