Advanced Search 
IEEE Transactions on Pattern Analysis and Machine Intelligence
April 1983 (vol. 5 no. 4)
ISSN: 0162-8828
Table of Contents
Papers
Masaki Oshima, Electrotechnical Laboratory, Ibaraki 305, Japan.
Yoshiaki Shirai, Electrotechnical Laboratory, Ibaraki 305, Japan.
pp. 353-361
Yukio Sato, MEMBER, IEEE, Department of Electronic Engineering, Faculty of Technology, Tokyo University of Agriculture and Technology, Koganei, Tokyo 184, Japan; Department of Electrical Engin
Ikuji Honda, Department of Mathematics, Keio University, Kohoku, Yokohama 223, Japan.
pp. 362-373
Eiji Kawaguchi, Department of Information Systems, Interdisciplinary Graduate School of Engineering Sciences, Kyushu University, Sakamoto 33, Kasuga, Fukuoka 816, Japan.
Tsutomu Endo, Department of Information Science and Systems Engineering, Oita University, Oita 870-11, Japan.
Jun-Ichi Matsunaga, Department of Information Systems, Interdisciplinary Graduate School of Engineering Sciences, Kyushu University, Sakamoto 33, Kasuga, Fukuoka 816, Japan.
pp. 373-384
Jonathan J. Hull, Department of Computer Science, State University of New York at Buffalo, Amherst, NY 14226.
Sargur N. Srihari, MEMBER, IEEE, Department of Computer Science, State University of New York at Buffalo, Amherst, NY 14226.
Ramesh Choudhari, Department of Computer Science, State University of New York at Buffalo, Amherst, NY 14226; Department of Computer Science, Claflin College, Orangeburg, SC 29115.
pp. 384-395
Ryszard S. Michalski, Department of Computer Science, University of Illinois, Urbana, IL 61801.
Robert E. Stepp, Department of Computer Science, University of Illinois, Urbana, IL 61801.
pp. 396-410
Keinosuke Fukunaga, FELLOW, IEEE, School of Electrical Engineering, Purdue University, West Lafayette, IN 47907.
Thomas E. Flick, School of Electrical Engineering, Purdue University, West Lafayette, IN 47907; Naval Research Laboratory, Washington, DC 20375.
pp. 410-416
Robert M. Haralick, SENIOR MEMBER, IEEE, Departments of Electrical Engineering and Computer Science, Virginia Polytechnic Institute and State University, Blacksburg, VA 24061.
pp. 417-428
Stanley L. Sclove, Department of Quantitative Methods, University of Illinois at Chicago, Chicago, IL 60680.
pp. 428-433
Masakazu Nagura, Visual Communication Applications Section, Yokosuka Electrical Communication Laboratory, Nippon Telegraph and Telephone Public Corporation, Yokosuka, Kanagawa 238, Japan.
Yasuhito Suenaga, Visual Communication Applications Section, Yokosuka Electrical Communication Laboratory, Nippon Telegraph and Telephone Public Corporation, Yokosuka, Kanagawa 238, Japan.
pp. 433-441
Soheil I. Sayegh, Department of Electrical and Computer Engineering, University of Wisconsin, Madison, WI 53706; Department of Electrical Engineering and Systems Science, Michigan State University,
Bahaa E. A. Saleh, Department of Electrical and Computer Engineering, University of Wisconsin, Madison, WI 53706.
pp. 441-445
Usage of this product signifies your acceptance of the Terms of Use.