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IEEE Transactions on Pattern Analysis and Machine Intelligence
March 1983 (vol. 5 no. 3)
ISSN: 0162-8828
Table of Contents
Papers
Drew Mcdermott, Department of Computer Science, Yale University, New Haven, CT 06520.
pp. 237-246
Steven A. Vere, MEMBER, IEEE, Information Systems Research Section, Jet Propulsion Laboratory, Pasadena, CA 91109.
pp. 246-267
Robert A. Hummel, MEMBER, IEEE, Courant Institute of Mathematical Sciences, New York University, New York, NY 10012.
Steven W. Zucker, MEMBER, IEEE, Computer Vision and Graphics Laboratory, Department of Electrical Engineering, McGill University, Montreal, P.Q., Canada H3A 2A7.
pp. 267-287
George C. Stockman, SENIOR MEMBER, IEEE, Department of Computer Science, Michigan State University, East Lansing, MI 48824.
Laveen N. Kanal, FELLOW, IEEE, Department of Computer Science, University of Maryland, College Park, MD 20742.
pp. 287-298
David B. Cooper, MEMBER, IEEE, Division of Engineering, Brown University, Providence, RI 02912.
Francis P. Sung, Division of Engineering, Brown University, Providence, RI 02912; Data General Corporation, West-boro, MA 01580.
pp. 299-316
Raul Machuca, White Sands Missile Range, U.S. Army, White Sands, NM 88002.
Keith Phillips, Department of Mathematics, New Mexico State University, Las Cruces, NM 88003; White Sands Missile Range, U.S. Army, White Sands, NM 88002.
pp. 316-329
John L. Mohammed, Artificial Intelligence Laboratory, Fair-child Central Research and Development, Palo Alto, CA 94304.
Robert A. Hummel, Courant Institute of Mathematical Sciences, New York University, New York, NY 10012.
Steven W. Zucker, Computer Vision and Robotics Laboratory, Department of Electrical Engineering, McGill University, Montreal, P.Q., Canada H3A 2A7.
pp. 330-332
T. C. Chen, Department of Electrical Engineering, Rice University, Houston, TX 77251; Bell Laboratories, Holmdel, NJ 07733.
Rui J. P. De Figueiredo, Departments of Electrical Engineering and Mathematical Sciences, Rice University, Houston, TX 77251.
pp. 332-337
Young-Ho Yum, Department of Electrical Sciences, Korea Advanced Institute of Science and Technology, Seoul, Korea.
Song B. Park, Department of Electrical Sciences, Korea Advanced Institute of Science and Technology, Seoul, Korea.
pp. 337-344
M. Shneier, Computer Science Center, University of Maryland, College Park, MD 20742; U.S. Department of Commerce, National Bureau of Standards, Washington, DC 20234.
pp. 345-349
Wesley E. Snyder, Department of Electrical Engineering, North Carolina State University, Raleigh, NC 27650.
Alan Cowart, Department of Electrical Engineering, North Carolina State University, Raleigh, NC 27650.
pp. 349-352
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