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IEEE Transactions on Pattern Analysis and Machine Intelligence
April 1982 (vol. 4 no. 4)
ISSN: 0162-8828
Table of Contents
Papers
Michael P. Windham, Department of Mathematics, Utah State University, Logan, UT 84322.
pp. 357-363
D. T. Lee, MEMBER, IEEE, Department of Electrical Engineering and Computer Science, Northwestern University, Evanston, IL 60201.
pp. 363-369
Kenneth P. Birman, Computer Science Division, Department of Electrical Engineering and Computer Science, University of California, Berkeley, CA 94720; 100 Wellington Avenue, New Rochelle, NY 10804.
pp. 369-380
Norman C. Griswold, MEMBER, IEEE, Department of Electrical Engineering, Texas A&M University, College Station, TX 77843.
Khalid Sayood, STUDENT MEMBER, IEEE, Department of Electrical Engineering, Texas A&M University, College Station, TX 77843.
pp. 380-391
Judea Pearl, SENIOR MEMBER, IEEE, Cognitive Systems Laboratory, School of Engineering and Applied Science, University of California, Los Angeles, CA 90024.
Jin H. Kim, Hughes Research Laboratories, Malibu, CA 90265.
pp. 392-399
H. Niemann, Lehrstuhl für Informatik 5, Universität Erlangen, Erlangen, West Germany.
G. Sagerer, Lehrstuhl für Informatik 5, Universität Erlangen, Erlangen, West Germany.
pp. 400-405
C. Guerra, Dipartimento di Matematica, Università della Calabria Arcavacata, Italy; Istituto di Automatica, Università di Roma, Roma, Italy.
G. G. Pieroni, Dipartimento di Matematica, Università della Calabria, Arcavacata, Italy.
pp. 405-408
Bir Bhanu, Image Processing Institute and Department of Electrical Engineering, University of Southern California, Los Angeles, CA 90007; Aeronutronic Division, Ford Aerospace and Communicati
Olivier D. Faugeras, Image Processing Institute, Department of Electrical Engineering, University of Southern California, Los Angeles, CA 90007; INRIA, Rocquencourt, France; University of Paris XI, Par
pp. 408-419
Shyuan Wang, Computer Vision Laboratory, Computer Science Center, University of Maryland, College Park, MD 20742.
Azriel Rosenfeld, Computer Vision Laboratory, Computer Science Center, University of Maryland, College Park, MD 20742.
Angela Y. Wu, Computer Vision Laboratory, Computer Science Center, University of Maryland, College Park, MD 20742; Department of Mathematics, Statistics, and Computer Science, American Universit
pp. 419-421
W. W. Loy, Laboratoire d'Automatique de Grenoble, Ecole Nationale Superieure d'Ingenieurs, Electronciens de Grenoble, St. Martin d'Heres, France.
I. D. Landau, Laboratoire d'Automatique de Grenoble, Ecole Nationale Superieure d'Ingenieurs, Electronciens de Grenoble, St. Martin d'Heres, France.
pp. 422-427
Keinosuke Fukunaga, Department of Electrical Engineering, Purdue University, West Lafayette, IN 47907.
James M. Mantock, Department of Electrical Engineering, Purdue University, West Lafayette, IN 47907; Aerospace Corporation, Los Angeles, CA 90009; Texas Instruments, Inc., Lewisville, TX 75067.
pp. 427-436
Firooz A. Sadjadi, Department of Electrical Engineering, University of Tennessee, Knoxville, TN 37916.
pp. 436-441
I. K. Sethi, Department of Electronics and Electrical Communication Engineering, Indian Institute of Technology, Kharagpur 721 302, India.
G. P. R. Sarvarayudu, Jawaharlal Nehru Technological University, India; Department of Electronics and Electrical Communication Engineering, Indian Institute of Technology, Kharagpur 721 302, India.
pp. 441-445
Edward T. Lee, Department of Mathematical Sciences, Memphis State University, Memphis, TN 38152.
pp. 445-449
A. P. Reeves, School of Electrical Engineering, Purdue University, West Lafayette, IN 47907.
A. Rostampour, School of Electrical Engineering, Purdue University, West Lafayette, IN 47907.
pp. 449-455
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