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IEEE Transactions on Pattern Analysis and Machine Intelligence
January 1982 (vol. 4 no. 1)
ISSN: 0162-8828
Table of Contents
Papers
Robert J. Schalkoff, MEMBER, IEEE, Department of Electrical Engineering, School of Engineering and Applied Science, University of Virginia, Charlottesvile, VA 22901; Department of Electrical Engineerin
Eugene S. Mcvey, FELLOW, IEEE, Department of Electrical Engineering, School of Engineering and Applied Science, University of Virginia, Charlottesille, VA 22901.
pp. 2-10
John E. Shore, SENIOR MEMBER, IEEE, Information Technology Division, Naval Research Laboratory, Washington, DC 20375.
Robert M. Gray, FELLOW, IEEE, Department of Electrical Engineering, Stanford University, Stanford, CA 94305.
pp. 11-17
Hatsukazu Tanaka, MEMBER, IEEE, Department of Electrical Engineering, Kobe University, Kobe, Japan.
Yutaka Hirakawa, Musashino Electrical Communication Laboratory, Nippon Telegraph and Telephone Public Corporation, Tokyo, Japan.
Seiko Kaneku, MEMBER, IEEE, Department of Electronics, Kagoshima University, Kagoshima, Japan.
pp. 18-25
Barry Levine, Department of Computer Science, Oregon State University, Corvallis, OR 97331.
pp. 25-34
Marvin Yablon, MEMBER, IEEE, Department of Mathematics, John Jay College of Criminal Justice, City University of New York, New York, NY 10019.
John T. Chu, Division of Management, Polytechnic Institute of New York, Brooklyn, NY 11201.
pp. 35-40
Jayaram K. Udupa, Medical Image Processing Group, Department of Computer Science, State University of New York at Buffalo, Amherst, NY 14226; Medical Image Processing Group, Department of Radiology,
Sargur N. Srihari, MEMBER, IEEE, Department of Computer Science, State University of New York at Buffalo, Amherst, NY 14226.
Gabor T. Herman, MEMBER, IEEE, Medical Image Processing Group, Department of Computer Science, State University of New York at Buffalo, Amherst, NY 14226; Medical Image Processing Group, Department
pp. 41-50
Roger Mohr, Department of Computer and Information Science, Moore School of Electrical Engineering, University of Pennsylvania, Philadelphia, PA 19104; CRIN, C.O. 140, 54047 Nancy Cedex, Franc
pp. 51
P. M. Narendra, Systems and Research Center, Honeywell, Inc., Minneapolis, MN 55413.
pp. 57-61
A. L. Vickers, Department of Electrical, Computer and Systems Engineering, Rensselaer Polytechnic Institute, Troy, NY 12181.
J. W. Modestino, Department of Electrical, Computer and Systems Engineering, Rensselaer Polytechnic Institute, Troy, NY 12181.
pp. 61-68
Tadao Wakayama, Yamato Research Section, Yokosuka Electrical Communication Laboratory, 1-2356 Take, Yokosuka-shi, Kanawaga-ken, Japan.
pp. 68-74
Rajjan Shinghal, Department of Computer Science, Con-cordia University, Montreal, P.Q., Canada.
Ching Y. Suen, Department of Computer Science, Con-cordia University, Montreal, P.Q., Canada.
pp. 74-78
Philip A. Dondes, Computer Vision Laboratory, Computer Science Center, University of Maryland, College Park, MD 20742.
Azriel Rosenfeld, Computer Vision Laboratory, Computer Science Center, University of Maryland, College Park, MD 20742.
pp. 79-84
Leszek Rutkowski, Department of Electrical Engineering, Technical University of Cz¿stochawa, Cz¿stochowa, Poland.
pp. 84-87
Kenneth R. Sloan, Department of Computer Science, University of Rochester, Rochester, NY 14627; Architec-ture Machine Group, Massachusetts Institute of Technology, Cam-bridge, MA 02139.
pp. 87-90
Angela Y. Wu, Computer Vision Laboratory, Computer Science Center, University of Maryland, College Park, MD 20742.
Tsai-Hong Hong, Computer Vision Laboratory, Computer Science Center, University of Maryland, College Park, MD 20742.
Azriel Rosenfeld, Computer Vision Laboratory, Computer Science Center, University of Maryland, College Park, MD 20742.
pp. 90-94
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