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IEEE Transactions on Pattern Analysis and Machine Intelligence
June 1981 (vol. 3 no. 6)
ISSN: 0162-8828
Table of Contents
Papers
Chul E. Kim, Department of Computer Science, University of Maryland, College Park, MD 20742.
pp. 617-625
Tsvi Dubitzki, Computer Vision Laboratory, Computer Science Center, University of Maryland, College Park, MD 20742; ELEX Control Systems, Israel.
Angela Y. Wu, Computer Vision Laboratory, Computer Science Center, University of Maryland, College Park, MD 20742; Department of Mathematics, Statistics, and Computer Science, American Universit
Azriel Rosenfeld, FELLOW, IEEE, Computer Vision Laboratory, Computer Science Center, University of Maryland, College Park, MD 20742.
pp. 626-633
Olivier D. Faugeras, MEMBER, IEEE, Image Processing Institute, University of Southern California, Los Angeles, CA 90007; Institut National de Recherche en Informatique et en Automatique, Le Chesnay, Fr
Keith E. Price, MEMBER, IEEE, Department of Electrical Engineering Systems, Image Processing Institute, University of Southern California, Los Angeles, CA 90007.
pp. 633-642
D. C. Clark, Department of Computer Science, University of Tennessee, Knoxville, TN 37916; Pattern Analysis and Recognition Corporation, Los Angeles, CA 90045.
R. C. Gonzalez, SENIOR MEMBER, IEEE, Department of Electrical Engineering, University of Tennessee, Knoxville, TN 37916.
pp. 643-655
Patrenahalli M. Narendra, MEMBER, IEEE, Systems and Research Center, Honeywell, Inc., Minneapolis, MN 55413.
Robert C. Fitch, MEMBER, IEEE, Systems and Research Center, Honeywell, Inc., Minneapolis, MN 55413.
pp. 655-661
Katsushi Ikeuchi, MEMBER, IEEE, Computer Vision Section, Electrotechnical Laboratory, Ministry of International Trade and Industry, Ibaraki 305,Japan.
pp. 661-669
Giovanni Tamburelli, Centro Studi e Laboratori Telecommunicazioni S.P.A., Torino, Italy.
pp. 670-676
T. W. Sze, Department of Electrical Engineering, University of Pittsburgh, Pittsburgh, PA 15261.
Y. H. Yang, Department of Electrical Engineering, University of Pittsburgh, Pittsburgh, PA 15261; Computer Engineering Center, Mellon Institute, Pittsburgh, PA 15213.
pp. 676-678
J. O. Eklundh, National Defense Research Institute, Linköping, Sweden.
A. Rosenfeld, Computer Vision Laboratory, Computer Science Center, University of Maryland, College Park, MD 20742.
pp. 679-683
Hanan Samet, Department of Computer Science, University of Maryland, College Park, MD 20742.
pp. 683-687
Shyuan Wang, Computer Vision Laboratory, Computer Science Center, University of Maryland, College Park, MD 20742.
Angela Y. Wu, Computer Vision Laboratory, Computer Science Center, University of Maryland, College Park, MD 20742.
Azriel Rosenfeld, Computer Vision Laboratory, Computer Science Center, University of Maryland, College Park, MD 20742.
pp. 687-696
Lawrence R. Johnson, Department of Computer Science, Michigan State University, East Lansing, MI 48823; SYSTEMS Engineering Laboratory, Fort Lauderdale, FL.
Anil K. Jain, Department of Computer Science, Michigan State University, East Lansing, MI 48823.
pp. 698-701
Gautam Biswas, Department of Computer Science, Michigan State University, East Lansing, MI 48824.
Anil K. Jain, Department of Computer Science, Michigan State University, East Lansing, MI 48824.
Richard C. Dubes, Department of Computer Science, Michigan State University, East Lansing, MI 48824.
pp. 701-708
D. J. Burr, Bell Laboratories, Holmdel, NJ 07733.
pp. 708-713
Philip H. Swain, Department of Natural Resources Conservation, University of Connecticut, Storrs, CT 06268.
Shirley M. Davis, Department of Natural Resources Conservation, University of Connecticut, Storrs, CT 06268.
pp. 713-714
D. A. Waterman, Department of Electrical Engineering and Computer Science, University of Connecticut, Storrs, CT 06268.
Frederick Hayes-Roth, Department of Electrical Engineering and Computer Science, University of Connecticut, Storrs, CT 06268.
pp. 714-715
Index Edics (PDF)
pp. 716-722
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