Advanced Search 
IEEE Transactions on Pattern Analysis and Machine Intelligence
April 1981 (vol. 3 no. 4)
ISSN: 0162-8828
Table of Contents
Papers
Nick J. Cerconie, MEMBER, IEEE, Department of Computing Science, Simon Fraser University, Burnaby, B.C., Canada.
pp. 357-367
Wallace S. Rutkowski, Computer Vision Laboratory, Computer Science Center, University of Maryland, College Park, MD 20742.
Shmuel Peleg, Computer Vision Laboratory, Computer Science Center, University of Maryland, College Park, MD 20742.
Azriel Rosenfeld, FELLOW, IEEE, Computer Vision Laboratory, Computer Science Center, University of Maryland, College Park, MD 20742.
pp. 368-375
Jaime G. Carbonell, Artificial Intelligence Project, Department of Computer Science, Yale University, New Haven, CT 06520; Department of Computer Science, Carnegie-Mellon University, Pittsburgh, PA 15
Richard E. Cullingford, MEMBER, IEEE, Artificial Intelligence Project, Department of Computer Science, Yale University, New Haven, CT 06520; Department of Electrical and Computer Science, University of Co
Anatole V. Gershman, Artifical Intelligence Project, Department of Computer Science, Yale University, New Haven, CT 06520; Schlumberger Research Laboratories, Ridgefield, CT 06877.
pp. 376-392
Vijay V. Raghavan, Department of Computer Science, University of Regina, Regina, Sask., Canada.
C. T. Yu, Department of Information Engineering, University of Illinois at Chicago Circle, Chicago, IL 60638.
pp. 393-402
Joel Quinqueton, INRIA, Rocquencourt, France.
Marc Berthod, INRIA, Rocquencourt, France.
pp. 403-412
Olivier D. Faugeras, MEMBER, IEEE, Image Processing Institute, University of Southern California, Los Angeles, CA 90007; INRIA, Rocquencourt, France; University of Paris XI, Paris, France.
Marc Berthod, INRIA, Rocquencourt, France.
pp. 412-424
Shigeki Yokoi, Department of Electronics Engineering, Faculty of Engineering, Mie University, Mie, Japan.
Jun-Ichiro Toriwaki, MEMBER, IEEE, Department of Electrical Engineering, Faculty of Engineering, Nagoya University, Nagoya, Japan; Department of Information and Computer Sciences, Toyohashi University
Teruo Fukumura, Department of Information Sciences, Faculty of Engineering, Nagoya University, Nagoya, Japan.
pp. 424-443
Christopher M. Brown, College of Engineering and Applied Science, University of Rochester, Rochester, NY 14627.
pp. 444-453
Victor Brailovsky, Department of Computer Science, University of Maryland, College Park, MD 20742.
pp. 454-459
Gyorgy Fekete, Computer Vision Laboratory, Computer Science Center, University of Maryland, College Park, MD 20742.
Jan-Olof Eklundh, National Defense Research Institute, Linköping, Sweden; Computer Vision Laboratory, Computer Science Center, University of Maryland, College Park, MD 20742.
Azriel Rosenfeld, Computer Vision Laboratory, Computer Science Center, University of Maryland, College Park, MD 20742.
pp. 459-469
Belur V. Sheela, ISRO Satellite Center, Bangalore, India.
Belur V. Dasarathy, Intergraph Corporation, Huntsville, AL 35805.
pp. 469-476
Kendall Preston, Department of Electrical Engineering, Carnegie-Mellon University, Pittsburgh, PA 15213.
pp. 476-481
David G. Morgenthaler, Computer Vision Laboratory, Computer Science Center, University of Maryland, College Park, MD 20742.
Azriel Rosenfeld, Computer Vision Laboratory, Computer Science Center, University of Maryland, College Park, MD 20742.
pp. 482-486
Usage of this product signifies your acceptance of the Terms of Use.