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IEEE Transactions on Pattern Analysis and Machine Intelligence
February 1980 (vol. 2 no. 2)
ISSN: 0162-8828
Table of Contents
Papers
Marvin Yablon, MEMBER, IEEE, Department of Mathematics, John Jay College of Criminal Justice, The City University of New York, New York, NY 10019.
J. T. Chu, Division of Management, Polytechnic Institute of New York, Brooklyn, NY 11201.
pp. 97-100
Jack Sklansky, SENIOR MEMBER, IEEE, Departments of Electrical Engineering, Information and Computer Science and Radiological Sciences, University of California, Irvine, CA 92717.
Leo Michelotti, Microelectronic Systems Division, Hughes Aircraft Company, Irvine, CA 92715.
pp. 101-111
Linda G. Shapiro, Department of Computer Science, Virginia Polytechnic Institute and State University, Blacksburg, VA 24061.
pp. 111-126
Firooz A. Sadjadi, STUDENT MEMBER, IEEE, Department of Electrical Engineering, University of Tennessee, Knoxville, TN 37916.
Ernest L. Hall, MEMBER, IEEE, Department of Electrical Engineering, University of Tennessee, Knoxville, TN 37916.
pp. 127-136
Renato De Mori, Istituto de Scienze dell'Informazione, Università di Torino, Torino, Italy.
Pietro Laface, CENS IENGF Istituto di Elettrotecnica, Politecnico di Torino, Torino, Italy.
pp. 136-148
Moshe Ben-Bassat, MEMBER, IEEE, Division of Critical Care Medicine and the Institute of Critical Care Medicine, University of Southern California School of Medicine, Los Angeles, CA 90027; Faculty o
Richard W. Carlson, Division of Critical Care Medicine and the Institute of Critical Care Medicine, University of Southern California School of Medicine, Los Angeles, CA 90027.
Venod K. Puri, Division of Critical Care Medicine and the Institute of Critical Care Medicine, University of Southern California School of Medicine, Los Angeles, CA 90027.
Mark D. Davenport, Division of Critical Care Medicine and the Institute of Critical Care Medicine, University of Southern California School of Medicine, Los Angeles, CA 90027.
John A. Schriver, Division of Critical Care Medicine and the Institute of Critical Care Medicine, University of Southern California School of Medicine, Los Angeles, CA 90027.
Mohamed Latif, Division of Critical Care Medicine and the Institute of Critical Care Medicine, University of Southern California School of Medicine, Los Angeles, CA 90027.
Ronald Smith, Division of Critical Care Medicine and the Institute of Critical Care Medicine, University of Southern California School of Medicine, Los Angeles, CA 90027.
Larry D. Portigal, Division of Critical Care Medicine and the Institute of Critical Care Medicine, University of Southern California School of Medicine, Los Angeles, CA 90027.
Edward H. Lipnick, Division of Critical Care Medicine and the Institute of Critical Care Medicine, University of Southern California School of Medicine, Los Angeles, CA 90027.
Max Harry Weil, SENIOR MEMBER, IEEE, Division of Critical Care Medicine and the Institute of Critical Care Medicine, University of Southern California School of Medicine, Los Angeles, CA 90027.
pp. 148-160
Satosi Watanabe, University of Hawaii, Honolulu, HI; Apartment 100 Homat Prince, 2-10-25 Moto-Azabus, Minatoku, Tokyo, Japan.
pp. 161-165
Jong-Sen Lee, Naval Research Laboratory, Washington, DC 20375.
pp. 165-168
Bruce Schachter, General Electric Company, Daytona Beach, FL 32015.
pp. 169-171
E. Fornasini, Department of Electrical Engineering, University of Padova, Padova, Italy.
G. Marchesini, Department of Electrical Engineering, University of Padova, Padova, Italy.
pp. 172-176
R. W. Schutten, Department of Electrical Engineering, Group on Measurement Science and Instrumentation, Twente University of Technology, Enschede, The Netherlands; Philips Research Laboratories, E
G. F. Vermeij, Department of Electrical Engineering, Group on Measurement Science and Instrumentation, Twente University of Technology, Enschede, The Netherlands.
pp. 176-180
Rajjan Shinghal, Department of Computer Science, Concordia University, Montreal, P.Q., Canada.
Godfried T. Toussaint, School of Computer Science, McGill University, Montreal, P.Q., Canada.
pp. 181-185
P. M. Narendra, Systems and Research Center, Honeywell, Inc., Minneapolis, MN 55413.
M. Goldberg, Department of Electrical Engineering, University of Ottawa, Ottawa, Ont., Canada.
pp. 185-191
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