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IEEE Transactions on Pattern Analysis and Machine Intelligence
January 1980 (vol. 2 no. 1)
ISSN: 0162-8828
Table of Contents
Papers
James C. Bezdek, Department of Mathematics, Utah State University, Logan, UT 84322.
pp. 1-8
W. A. Perkins, Computer Science Department, General Motors Research Laboratories, Warren, MI 48090.
pp. 8-15
John M. Prager, Department of Computer and Information Science, University of Massachusetts, Amherst, MA 01003; IBM Scientific Center, Cambridge, MA 02139.
pp. 16-27
Eiji Kawaguchi, Department of Computer Science and Communication Engineering, Kyushu University, Fukuoka, Japan.
Tsutomu Endo, Department of Computer Science and Communication Engineering, Kyushu University, Fukuoka, Japan.
pp. 27-35
Jeffrey M. Lane, Boeing Commercial Airplane Company, Seattle, WA 98124.
Richard F. Riesenfeld, Department of Computer Science, University of Utah, Salt Lake City, UT 84112.
pp. 35-46
Alton L. Gilbert, MEMBER, IEEE, U.S. Army White Sands Missile Range, White Sands, NM 88002.
Michael K. Giles, U.S. Army White Sands Missile Range, White Sands, NM 88002.
Gerald M. Flachs, MEMBER, IEEE, Department of Electrical Engineering, New Mexico State University, Las Cruces, NM 88003.
Robert B. Rogers, MEMBER, IEEE, Department of Electrical Engineering, New Mexico State University, Las Cruces, NM 88003.
U Yee Hsun, MEMBER, IEEE, Department of Electrical Engineering, New Mexico State University, Las Cruces, NM 88003; Texas Instruments Incorporated, Dallas, TX 75222.
pp. 47-56
Moshe Ben-Bassat, Center for the Critically Ill, School of Medicine, University of Southern California, Los Angeles, CA 90027; Faculty of Management, Tel Aviv University, Tel Aviv, Israel.
pp. 57-61
Dimitri Kazakos, Department of Electrical Engineering, State University of New York at Buffalo, Amherst, NY 14260.
Theodore Cotsidas, Department of Electrical Engineering, State University of New York at Buffalo, Amherst, NY 14260.
pp. 61-67
J. O. Eklundh, Defense Research Institute, Stockholm, Sweden.
H. Yamamoto, National Aerospace Laboratory, Tokyo, Japan.
A. Rosenfeld, Computer Science Center, University of Maryland, College Park, MD 20742.
pp. 72-75
S. Lobregt, Pattern Recognition Group, Department of Applied Physics, Delft University of Technology, Delft, The Netherlands.
P. W. Verbeek, Pattern Recognition Group, Department of Applied Physics, Delft University of Technology, Delft, The Netherlands.
F. C. A. Groen, Pattern Recognition Group, Department of Applied Physics, Delft University of Technology, Delft, The Netherlands.
pp. 75-77
H. C. Du, Institute of Applied Mathematics, National Tsing Hua University, Hsinchu, Taiwan; Department of Computer Sciences, University of Washington, Seattle, WA 98105.
R. C. T. Lee, Institute of Computer and Decision Sciences, National Tsing Hua University, Hsinchu, Taiwan.
pp. 83-90
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