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IEEE Transactions on Pattern Analysis and Machine Intelligence
March 1979 (vol. 1 no. 3)
ISSN: 0162-8828
Table of Contents
Papers
Mark A. Vogel, MEMBER, IEEE, The Analytic Sciences Corporation, Reading, MA 01867.
Andrew K. C. Wong, Department of Systems Design, University of Waterloo, Waterloo, Ont., Canada.
pp. 237-245
Takeshi Agui, Imaging Science and Engineering Laboratory, Tokyo Institute of Technology, Midori-Ku, Yokohama, Japan.
Masayuki Nakajima, Imaging Science and Engineering Laboratory, Tokyo Institute of Technology, Midori-Ku, Yokohama, Japan.
Tae K. Kim, Choong-nam National University, Taejon-City, Korea.
Eduardo T. Takahashi, Department of Computer Science, Universidade Estadual de Campinas, Campinas, Brazil.
pp. 245-251
Larry S. Davis, Department of Computer Science, University of Texas at Austin, Austin, TX 78712.
Steven A. Johns, Abbott Laboratories, Dallas, TX.
J. K. Aggarwal, FELLOW, IEEE, Department of Electrical Engineering, University of Texas at Austin, Austin, TX 78712.
pp. 251-259
Richard O. Duda, SENIOR MEMBER, IEEE, Artificial Intelligence Center, SRI International, Menlo Park, CA 94025.
David Nitzan, SENIOR MEMBER, IEEE, Artificial Intelligence Center, SRI International, Menlo Park, CA 94025.
Phyllis Barrett, Artificial Intelligence Center, SRI International, Menlo Park, CA 94025.
pp. 259-271
Harry Wechsler, School of Electrical Engineering, Purdue University, West Lafayette, IN 47907; Departments of Electrical Engineering and Computer Science, University of Wisconsin, Milwaukee, WI 53
Masatsugu Kidode, MEMBER, IEEE, Toshiba Research and Development Center, Komukai Toshiba-Cho, Saiwai-Ku, Kawasaki City, Kanagawa, Japan.
pp. 272-280
Shi-Kuo Chang, Knowledge Systems Laboratory, Department of Information Engineering, University of Illinois, Chicago, IL 60680.
Jyh-Sheng Ke, Knowledge Systems Laboratory, Department of Information Engineering, University of Illinois, Chicago, IL 60680.
pp. 281-294
Joseph O'Rourke, Department of Computer Science, Moore School of Electrical Engineering, University of Pennsylvania, Philadelphia, PA 19104.
Norman Badler, Department of Computer Science, Moore School of Electrical Engineering, University of Pennsylvania, Philadelphia, PA 19104.
pp. 295-305
G. V. Trunk, Naval Research Laboratory, Washington, DC 20375.
pp. 306-307
G. Eden, Medische Informatica, Vrije Universiteit, Amsterdam, The Netherlands.
pp. 307
Theodosios Pavlidis, Department of Electrical Engineering and Computer Science, Princeton University, Princeton, NJ 08544.
pp. 307-310
Stephen D. Shapiro, Department of Electrical Engineering, Stevens Institute of Technology, Hoboken, NJ 07030.
Anthony Iannino, Department of Electrical Engineering, Stevens Institute of Technology, Hoboken, NJ 07030.
pp. 310-317
Jan-Olof Eklundh, National Defense Research Institute, Stockholm, Sweden; Computer Science Center, University of Maryland, College Park, MD 20742.
A. Rosenfeld, Computer Science Center, University of Maryland, College Park, MD 20742.
pp. 317-325
Robert Y. Wong, Department of Electrical Engineering, California State University, Northridge, CA 91330.
Ernest L. Hall, Department of Electrical Engineering, University of Tennessee, Knoxville, TN 37916.
pp. 325-330
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