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IEEE Transactions on Pattern Analysis and Machine Intelligence
February 1979 (vol. 1 no. 2)
ISSN: 0162-8828
Table of Contents
Papers
Preface (PDF)
Y. T. Chien, Guest Editor, Professor and Head of the Department of Electrical Engineering and Computer Science.
Theodosios Pavlidis, Guest Editor, member of the Association for Computing Machinery and Sigma Xi, member of the editorial committee of the IEEE TRANSACTIONS OF PATTERN ANALYSIS AND MACHINE INTELLIGENC
pp. 125-126
J. W. Roach, STUDENT MEMBER, IEEE, Department of Electrical Engineering and Computer Science, University of Texas, Austin, TX 78712.
J. K. Aggarwal, FELLOW, IEEE, Department of Electrical Engineering and Computer Science, University of Texas, Austin, TX 78712.
pp. 127-135
Gregory Y. Tang, Department of Electrical Engineering, State University of New York at Buffalo, Amherst, NY 14260.
Thomas S. Huang, FELLOW, IEEE, Department of Electrical Engineering, Purdue University, West Lafayette, IN 47907.
pp. 135-144
Gregory M. Hunter, MEMBER, IEEE, Decisions and Designs, Inc., McLean, VA 22101.
Kenneth Steiglitz, MEMBER, IEEE, Department of Electrical Engineering and Computer Science, Princeton University, Princeton, NJ 08540.
pp. 145-153
R. L. Kashyap, SENIOR MEMBER, IEEE, Departnent of Electrical Engineering, Purdue University, West Lafayette, IN 47907.
pp. 154-163
Ching Y. Suen, SENIOR MEMBER, IEEE, Department of Computer Science, Concordia University, Montreal, P.Q., Canada; Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambri
pp. 164-172
Robert M. Haralick, SENIOR MEMBER, IEEE, Department of Electrical Engineering, Virginia Polytechnic Institute and State University, Blacksburg, VA 24061.
Linda G. Shapiro, Department of Computer Science, Kansas State University, Manhattan, KS 66506; Department of Computer Science, Virginia Polytechnic Institute and State University, Blacksburg, VA 24
pp. 173-184
Rajjan Shinghal, MEMBER, IEEE, Department of Computer Science, Concordia University, Montreal, P.Q., Canada.
Godfried T. Toussaint, MEMBER, IEEE, School of Computer Science, McGill University, Montreal, P.Q., Canada.
pp. 184-193
Laveen N. Kanal, FELLOW, IEEE, Department of Computer Science, Laboratory for Pattern Analysis, University of Maryland, College Park, MD 20742.
pp. 193-201
Indranil Chakravarty, Department of Electrical and Systems Engineering, Rensselaer Polytechnic Institute, Troy, NY 12181.
pp. 202-205
Ramesh Jain, Department of Electrical Engineering, University of Texas at Austin, Austin, TX 78712; Department of Computer Science, Wayne State University, Detroit, MI 48202.
H.-H. Nagel, Fachbereich Informatik, Universitaet Hamburg, Hamburg, Germany.
pp. 206-214
L. Vanderheydt, Division of Human Genetics, Department of Human Biology, Minderbroederstraat 12, Leuven, Belgium.
A. Oosterlinck, Division of Human Genetics, Department of Human Biology, Minderbroederstraat 12, Leuven, Belgium.
H. Van Den Berghe, Division of Human Genetics, Department of Human Biology, Minderbroederstraat 12, Leuven, Belgium.
pp. 214-224
David L. Davies, Department of Electrical Engineering, University of Tennessee, Knoxville, TN 37916; 17 C Downey Drive, Manchester, CT 06040.
Donald W. Bouldin, Department of Electrical Engineering, University of Tennessee, Knoxville, TN 37916.
pp. 224-227
J. Birk, Department of Electrical Engineering, University of Rhode Island, Kingston, RI 02881.
R. Kelley, Department of Electrical Engineering, University of Rhode Island, Kingston, RI 02881.
N. Chen, Department of Electrical Engineering, University of Rhode Island, Kingston, RI 02881.
L. Wilson, Department of Electrical Engineering, University of Rhode Island, Kingston, RI 02881; Texas Instruments, Inc., Attleboro, MA 02703.
pp. 228-235
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