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2008 IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops
High-quality scanning using time-of-flight depth superresolution
Anchorage, AK, USA
June 23-June 28
ISBN: 978-1-4244-2339-2
Sebastian Schuon, Stanford University, USA
Christian Theobalt, Stanford University, USA
James Davis, UC Santa Cruz, USA
Sebastian Thrun, Stanford University, USA
Time-of-flight (TOF) cameras robustly provide depth data of real world scenes at video frame rates. Unfortunately, currently available camera models provide rather low X-Y resolution. Also, their depth measurements are starkly influenced by random and systematic errors which renders them inappropriate for high-quality 3D scanning. In this paper we show that ideas from traditional color image superresolution can be applied to TOF cameras in order to obtain 3D data of higher X-Y resolution and less noise. We will also show that our approach, which works using depth images only, bears many advantages over alternative depth upsampling methods that combine information from separate high-resolution color and low-resolution depth data.
Citation:
Sebastian Schuon, Christian Theobalt, James Davis, Sebastian Thrun, "High-quality scanning using time-of-flight depth superresolution," cvprw, pp.1-7, 2008 IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops, 2008
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