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Capturing Compliance Requirements: A Pattern-Based Approach
May-June 2012 (vol. 29 no. 3)
pp. 28-36
ASCII Text
x 
 
Oktay Turetken, Amal Elgammal, Willem-Jan van den Heuvel, Michael P. Papazoglou, "Capturing Compliance Requirements: A Pattern-Based Approach," IEEE Software, vol. 29, no. 3, pp. 28-36, May-June, 2012.
 
 
BibTex
x
 
@article{ 10.1109/MS.2012.45,
author = {Oktay Turetken and Amal Elgammal and Willem-Jan van den Heuvel and Michael P. Papazoglou},
title = {Capturing Compliance Requirements: A Pattern-Based Approach},
journal ={IEEE Software},
volume = {29},
number = {3},
issn = {0740-7459},
year = {2012},
pages = {28-36},
doi = {http://doi.ieeecomputersociety.org/10.1109/MS.2012.45},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Software
TI - Capturing Compliance Requirements: A Pattern-Based Approach
IS - 3
SN - 0740-7459
SP28
EP36
EPD - 28-36
A1 - Oktay Turetken,
A1 - Amal Elgammal,
A1 - Willem-Jan van den Heuvel,
A1 - Michael P. Papazoglou,
PY - 2012
KW - business process management
KW - representations
KW - business process compliance
KW - business process
KW - software engineering
VL - 29
JA - IEEE Software
ER -
 
Oktay Turetken, Tilburg University
Amal Elgammal, Tilburg University
Willem-Jan van den Heuvel, Tilburg University
Michael P. Papazoglou, Tilburg University
Ensuring compliance to laws, regulations, and standards in a constantly changing business environment is a major challenge for companies. So, organizations have an increasing need for systematic approaches to manage compliance throughout the business process (BP) life cycle. A new pattern-based approach, including a toolset, captures and manages BP compliance requirements. This approach is a first step toward comprehensive management of BP compliance and acts as a springboard to fully automate and continuously audit BPs.

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Index Terms:
business process management, representations, business process compliance, business process, software engineering
Citation:
Oktay Turetken, Amal Elgammal, Willem-Jan van den Heuvel, Michael P. Papazoglou, "Capturing Compliance Requirements: A Pattern-Based Approach," IEEE Software, vol. 29, no. 3, pp. 28-36, May-June 2012, doi:10.1109/MS.2012.45
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