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May/June 2007 (vol. 24 no. 3)
pp. 24-30
ASCII Text
x 
 
Ron Jeffries, Grigori Melnik, "Guest Editors' Introduction: TDD--The Art of Fearless Programming," IEEE Software, vol. 24, no. 3, pp. 24-30, May/June, 2007.
 
 
BibTex
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@article{ 10.1109/MS.2007.75,
author = {Ron Jeffries and Grigori Melnik},
title = {Guest Editors' Introduction: TDD--The Art of Fearless Programming},
journal ={IEEE Software},
volume = {24},
number = {3},
issn = {0740-7459},
year = {2007},
pages = {24-30},
doi = {http://doi.ieeecomputersociety.org/10.1109/MS.2007.75},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Software
TI - Guest Editors' Introduction: TDD--The Art of Fearless Programming
IS - 3
SN - 0740-7459
SP24
EP30
EPD - 24-30
A1 - Ron Jeffries,
A1 - Grigori Melnik,
PY - 2007
KW - program testing
KW - software engineering
KW - test-driven development
KW - TDD
VL - 24
JA - IEEE Software
ER -
 
Ron Jeffries, Independent Consultant
Grigori Melnik, University of Calgary
Test-driven development is a discipline of design and programming where every line of new code is written in response to a test the programmer writes just before coding. This special issue of IEEE Software includes seven feature articles on various aspects of TDD and a Point/Counterpoint debate on the use of mock objects in applying it. The articles demonstrate the ways TDD is being used in nontrivial situations (database development, embedded software development, GUI development, performance tuning), signifying an adoption level for the practice beyond the visionary phase and into the early mainstream. In this introduction to the special issue on TDD, the guest editors also summarize selected TDD empirical studies from industry and academia.
Index Terms:
program testing, software engineering, test-driven development, TDD
Citation:
Ron Jeffries, Grigori Melnik, "Guest Editors' Introduction: TDD--The Art of Fearless Programming," IEEE Software, vol. 24, no. 3, pp. 24-30, May-June 2007, doi:10.1109/MS.2007.75
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