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| Anthony M. Orme, Haining Yao, Letha H. Etzkorn, "Coupling Metrics for Ontology-Based Systems," IEEE Software, vol. 23, no. 2, pp. 102-108, March/April, 2006. | |||
| BibTex | x | ||
| @article{ 10.1109/MS.2006.46, author = {Anthony M. Orme and Haining Yao and Letha H. Etzkorn}, title = {Coupling Metrics for Ontology-Based Systems}, journal ={IEEE Software}, volume = {23}, number = {2}, issn = {0740-7459}, year = {2006}, pages = {102-108}, doi = {http://doi.ieeecomputersociety.org/10.1109/MS.2006.46}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - IEEE Software TI - Coupling Metrics for Ontology-Based Systems IS - 2 SN - 0740-7459 SP102 EP108 EPD - 102-108 A1 - Anthony M. Orme, A1 - Haining Yao, A1 - Letha H. Etzkorn, PY - 2006 KW - ontology KW - metric KW - measure VL - 23 JA - IEEE Software ER - | |||
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MS.2006.46
XML has become common in Internet-based application domains such as business-to-business and business-to-consumer applications. It has also formed a basis for service-oriented architectures such as Web services and the Semantic Web, particularly because ontology data employed in the Semantic Web are stored in XML. Measuring system coupling is a commonly accepted software engineering practice associated with producing high-quality software products. In many application domains, we can assess coupling in ontology-based systems before system development by measuring coupling in ontology data. (Because ontologies are built independently of applications that access them, they can be assessed for coupling before system development.) A proposed set of metrics measures coupling of ontology data in ontology-based systems represented in the Web Ontology Language (OWL), a derivative of XML. A real-world study demonstrates the metrics? use in integrating ontologies.
Index Terms:
ontology, metric, measure
Citation:
Anthony M. Orme, Haining Yao, Letha H. Etzkorn, "Coupling Metrics for Ontology-Based Systems," IEEE Software, vol. 23, no. 2, pp. 102-108, March-April 2006, doi:10.1109/MS.2006.46
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