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Long-Term Testing in a Short-Term World
May/June 2003 (vol. 20 no. 3)
pp. 64-67

Accelerated stress testing reduces the calendar time required to test a system, but this technique can be hard to apply to functions that run on a fixed schedule. This article describes how to accelerate the testing of scheduled functions by triggering them through automated tests, either by periodically advancing the system clock or through a programmatic event interface. With this method, the accelerated stress tests don?t distort the system?s operational profile.

Index Terms:
Testing strategies, accelerated stress testing, system clock, scheduled functions, operational profile
Citation:
Vaughn T. Rokosz, "Long-Term Testing in a Short-Term World," IEEE Software, vol. 20, no. 3, pp. 64-67, May-June 2003, doi:10.1109/MS.2003.1196323
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