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When to Test Less
September/October 2000 (vol. 17 no. 5)
pp. 107-112
ASCII Text
x 
 
Tim Menzies, Bojan Cukic, "When to Test Less," IEEE Software, vol. 17, no. 5, pp. 107-112, September/October, 2000.
 
 
BibTex
x
 
@article{ 10.1109/52.877876,
author = {Tim Menzies and Bojan Cukic},
title = {When to Test Less},
journal ={IEEE Software},
volume = {17},
number = {5},
issn = {0740-7459},
year = {2000},
pages = {107-112},
doi = {http://doi.ieeecomputersociety.org/10.1109/52.877876},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Software
TI - When to Test Less
IS - 5
SN - 0740-7459
SP107
EP112
EPD - 107-112
A1 - Tim Menzies,
A1 - Bojan Cukic,
PY - 2000
VL - 17
JA - IEEE Software
ER -
 
The authors argue that, for many small-scale projects, a small number of randomly selected tests will adequately probe the software. They discuss how a program's shape can help determine whether rapid testing with limited resources will be as effective as elaborate and expensive testing regimes.

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Citation:
Tim Menzies, Bojan Cukic, "When to Test Less," IEEE Software, vol. 17, no. 5, pp. 107-112, Sept.-Oct. 2000, doi:10.1109/52.877876
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