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The Combinatorial Design Approach to Automatic Test Generation
September 1996 (vol. 13 no. 5)
pp. 83-88

The combinatorial design method substantially reduces testing costs. The authors describe an application in which the method reduced test plan development from one month to less than a week. In several experiments, the method demonstrated good code coverage and fault detection ability.

Citation:
David M. Cohen, Siddhartha R. Dalal, Jesse Parelius, Gardner C. Patton, "The Combinatorial Design Approach to Automatic Test Generation," IEEE Software, vol. 13, no. 5, pp. 83-88, Sept. 1996, doi:10.1109/52.536462
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