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The Combinatorial Design Approach to Automatic Test Generation
September 1996 (vol. 13 no. 5)
pp. 83-88
| ASCII Text | x | ||
| David M. Cohen, Siddhartha R. Dalal, Jesse Parelius, Gardner C. Patton, "The Combinatorial Design Approach to Automatic Test Generation," IEEE Software, vol. 13, no. 5, pp. 83-88, September, 1996. | |||
| BibTex | x | ||
| @article{ 10.1109/52.536462, author = {David M. Cohen and Siddhartha R. Dalal and Jesse Parelius and Gardner C. Patton}, title = {The Combinatorial Design Approach to Automatic Test Generation}, journal ={IEEE Software}, volume = {13}, number = {5}, issn = {0740-7459}, year = {1996}, pages = {83-88}, doi = {http://doi.ieeecomputersociety.org/10.1109/52.536462}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - IEEE Software TI - The Combinatorial Design Approach to Automatic Test Generation IS - 5 SN - 0740-7459 SP83 EP88 EPD - 83-88 A1 - David M. Cohen, A1 - Siddhartha R. Dalal, A1 - Jesse Parelius, A1 - Gardner C. Patton, PY - 1996 VL - 13 JA - IEEE Software ER - | |||
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/52.536462
The combinatorial design method substantially reduces testing costs. The authors describe an application in which the method reduced test plan development from one month to less than a week. In several experiments, the method demonstrated good code coverage and fault detection ability.
Citation:
David M. Cohen, Siddhartha R. Dalal, Jesse Parelius, Gardner C. Patton, "The Combinatorial Design Approach to Automatic Test Generation," IEEE Software, vol. 13, no. 5, pp. 83-88, Sept. 1996, doi:10.1109/52.536462
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