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Predicting Where Faults Can Hide from Testing
March/April 1991 (vol. 8 no. 2)
pp. 41-48
ASCII Text
x 
 
Jeffrey Voas, Larry Morrel, Keith Miller, "Predicting Where Faults Can Hide from Testing," IEEE Software, vol. 8, no. 2, pp. 41-48, March/April, 1991.
 
 
BibTex
x
 
@article{ 10.1109/52.73748,
author = {Jeffrey Voas and Larry Morrel and Keith Miller},
title = {Predicting Where Faults Can Hide from Testing},
journal ={IEEE Software},
volume = {8},
number = {2},
issn = {0740-7459},
year = {1991},
pages = {41-48},
doi = {http://doi.ieeecomputersociety.org/10.1109/52.73748},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Software
TI - Predicting Where Faults Can Hide from Testing
IS - 2
SN - 0740-7459
SP41
EP48
EPD - 41-48
A1 - Jeffrey Voas,
A1 - Larry Morrel,
A1 - Keith Miller,
PY - 1991
KW - sensitivity analysis; program location; failure-causing fault; fault/failure model; fault location; execution; infection; propagation; probability estimates; testability; probability; program testing; sensitivity analysis
VL - 8
JA - IEEE Software
ER -
 

Sensitivity analysis, which estimates the probability that a program location can hide a failure-causing fault, is addressed. The concept of sensitivity is discussed, and a fault/failure model that accounts for fault location is presented. Sensitivity analysis requires that every location be analyzed for three properties: the probability of execution occurring, the probability of infection occurring, and the probability of propagation occurring. One type of analysis is required to handle each part of the fault/failure model. Each of these analyses is examined, and the interpretation of the resulting three sets of probability estimates for each location is discussed. The relationship of the approach to testability is considered.

Index Terms:
sensitivity analysis; program location; failure-causing fault; fault/failure model; fault location; execution; infection; propagation; probability estimates; testability; probability; program testing; sensitivity analysis
Citation:
Jeffrey Voas, Larry Morrel, Keith Miller, "Predicting Where Faults Can Hide from Testing," IEEE Software, vol. 8, no. 2, pp. 41-48, March-April 1991, doi:10.1109/52.73748
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