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March/April 1991 (vol. 8 no. 2)
pp. 9-11
Citation:
Young-fu Chang, Mikio Aoyama, "Guest Editor's Introduction: Testing the Limits of Test Technology," IEEE Software, vol. 8, no. 2, pp. 9-11, March-April 1991, doi:10.1109/MS.1991.10013
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