This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
Generating Test Data with Enhanced Context-Free Grammars
July/August 1990 (vol. 7 no. 4)
pp. 50-55

The use of context-free grammars to improve functional testing of very-large-scale integrated circuits is described. It is shown that enhanced context-free grammars are effective tools for generating test data. The discussion covers preliminary considerations, the first tests, generating systematic tests, and testing subroutines. The author's experience using context-free grammars to generate tests for VLSI circuit simulators indicates that they are remarkably effective tools that virtually anyone can use to debug virtually any program.

Index Terms:
test data generation; context-free grammars; functional testing; very-large-scale integrated circuits; systematic tests; testing subroutines; VLSI circuit simulators; debug; context-free grammars; integrated circuit testing; VLSI
Citation:
Peter M. Maurer, "Generating Test Data with Enhanced Context-Free Grammars," IEEE Software, vol. 7, no. 4, pp. 50-55, July-Aug. 1990, doi:10.1109/52.56422
Usage of this product signifies your acceptance of the Terms of Use.