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| S. Wedge, R. Daniels, H. von Sosen, "Multicore Algorithms for Transient Noise Simulation," IEEE Design & Test of Computers, vol. 99, no. 1, pp. 1, , 5555. | |||
| BibTex | x | ||
| @article{ 10.1109/MDT.2012.2226423, author = {S. Wedge and R. Daniels and H. von Sosen}, title = {Multicore Algorithms for Transient Noise Simulation}, journal ={IEEE Design & Test of Computers}, volume = {99}, number = {1}, issn = {0740-7475}, year = {5555}, pages = {1}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2012.2226423}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - IEEE Design & Test of Computers TI - Multicore Algorithms for Transient Noise Simulation IS - 1 SN - 0740-7475 SP EP EPD - 1 A1 - S. Wedge, A1 - R. Daniels, A1 - H. von Sosen, PY - 5555 KW - verification KW - Analog KW - circuit simulation KW - parallel algorithms KW - noise KW - jitter VL - 99 JA - IEEE Design & Test of Computers ER - | |||
Accurate simulation of analog and mixed-signal circuit designs prior to fabrication is a necessity to confirm that adequate performance is achieved over process, voltage, and environmental variations. With advanced nanometer semiconductor processes, there is the additional challenge of broad noise bandwidths that cause signals and noise to interact. Including the nonlinear interactions of random electronic noise in simulations has therefore become a necessity. Yet, the additional computational burden of including random noise effects in SPICE-accurate circuit simulations has been prohibitive. Discussed here are effective techniques for modifying SPICE algorithms to take full advantage of multicore computing architectures to achieve fast, efficient, and scalable simulations of electronic circuits under the influence of random noise.
Index Terms:
verification,Analog,circuit simulation,parallel algorithms,noise,jitter
Citation:
S. Wedge, R. Daniels, H. von Sosen, "Multicore Algorithms for Transient Noise Simulation," IEEE Design & Test of Computers, 24 Oct. 2012. IEEE computer Society Digital Library. IEEE Computer Society, <http://doi.ieeecomputersociety.org/10.1109/MDT.2012.2226423>
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