Advanced Search 
IEEE Design & Test of Computers
April 2013 (vol. 30 no. 2)
ISSN: 0740-7475
Table of Contents
Papers
Swarup Bhunia, Electrical Engineering and Computer Science, Case Western Reserve University, Cleveland, OH, USA
Dakshi Agrawal, IBM TJ Watson Research Center , Yorktown Heights, USA
Leyla Nazhandali, Virginia Tech , Blacksburg,
pp. 5-7
Kan Xiao, ECE Dept., Univ. of Connecticut, Storrs, CT, USA
Xuehui Zhang, ECE Dept., Univ. of Connecticut, Storrs, CT, USA
Mohammad Tehranipoor, ECE Dept., Univ. of Connecticut, Storrs, CT, USA
pp. 26-34
J. Rajendran, Polytech. Inst., New York Univ., New York, OH, USA
A. K. Kanuparthi, Polytech. Inst., New York Univ., New York, NY, USA
M. Zahran, New York Univ., New York, NY, USA
S. K. Addepalli, Cisco, USA
G. Ormazabal, Columbia Univ., New York, NY, USA
R. Karri, Polytech. Inst., New York Univ., New York, OH, USA
pp. 35-44
P. Reviriego, Univ. Antonio de Nebrija, Madrid, Spain
C. J. Bleakley, Univ. Antonio de Nebrija, Madrid, Spain
J. A. Maestro, Univ. Coll. Dublin, Dublin, Ireland
pp. 87-95
Theo Theocharides, Department of Electrical and Computer Engineering, University of Cyprus, Nicosia, Cyprus
pp. 100-101
C. Fletcher, MIT CSAIL, Cambridge, MA, USA
M. van Dijk, MIT CSAIL, Cambridge, MA, USA
S. Devadas, MIT CSAIL, Cambridge, MA, USA
pp. 103-104
Usage of this product signifies your acceptance of the Terms of Use.