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IEEE Design & Test of Computers
Dec. 2012 (vol. 29 no. 6)
ISSN: 0740-7475
Table of Contents
Papers
Dejan Markovic, University of California, Los Angeles, Los Angeles,
Rashmi Nanda, University of California, Los Angeles,
pp. 19-26
Andrew B. Kahng, Department of Computer Science and Engineering , University of California at San Diego, La Jolla,
pp. 101-102
Mau-Chung Frank Chang, University of California, Los Angeles, Los Angeles,
Frank Hsiao, University of California, Los Angeles, Los Angeles,
Charles Chien, CreoNex Systems Inc., Westlake Village,
Adrian Tang, University of California, Los Angeles, Los Angeles,
pp. 40-51
Paul D. Franzon, Electrical and Computer Engineering, North Carolina State University, Raleigh , NC, USA
Michael B. Steer, Electrical and Computer Engineering, North Carolina State University, Raleigh , NC, USA
Ting Zhu, Electrical and Computer Engineering, North Carolina State University, Raleigh ,
pp. 74-83
Theo Theocharides, Department of Electrical and Computer Engineering, University of Cyprus, 75 Kallipoleos Avenue, Nicosia, Cyprus
pp. 111-112
Huaxing Tang, Mentor Graphics Wilsonville , Oregon, USA
Kathy Yang, Mentor Graphics Wilsonville , Oregon, USA
Geir Eide, Mentor Graphics Wilsonville , Oregon, USA
Markus Seuring, Advantest Europe Böblingen , Germany
Michael Braun, Advantest Europe Böblingen , Germany
Alan Ma, Advanced Micro Devices, Inc. , Toronto, Canada
pp. 91-99
Haralampos-G. Stratigopoulos, TIMA Laboratory (CNRS-Grenoble INP-UJF), Grenoble, France
Alberto Valdes-Garcia, IBM T.J. Watson Research Center , Yorktown Heights, NY, USA
pp. 5-6
Robert Bogdan Staszewski, Dept. of Microelectronics, Delft University of Technology, Delft, The Netherlands
pp. 7-18
Gregory Creech, Ohio State University,
Len Orlando, Air Force Research Laboratory ,
Aji Mattamana, Air Force Research Laboratory ,
Jay Rockway, SPAWAR Systems Center Pacific ,
Sanjay Raman, Defense Advanced Research Projects Agency,
Kari Groves, Air Force Research Laboratory ,
Tony Quach, Air Force Research Laboratory ,
Christopher Maxey, Booz Allen Hamilton,
pp. 27-39
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