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IEEE Design & Test of Computers
Dec. 2012 (vol. 29 no. 6)
ISSN: 0740-7475
Table of Contents
Papers
Theo Theocharides, Department of Electrical and Computer Engineering, University of Cyprus, 75 Kallipoleos Avenue, Nicosia, Cyprus
pp. 111-112
Haralampos-G. Stratigopoulos, TIMA Laboratory (CNRS-Grenoble INP-UJF), Grenoble, France
Alberto Valdes-Garcia, IBM T.J. Watson Research Center , Yorktown Heights, NY, USA
pp. 5-6
A. B. Kahng, Dept. of Comput. Sci. & Eng., Univ. of California at San Diego, La Jolla, CA, USA
pp. 101-102
F. Hsiao, Univ. of California, Los Angeles, Los Angeles, CA, USA
A. Tang, Univ. of California, Los Angeles, Los Angeles, CA, USA
C. Chien, CreoNex Syst. Inc., Westlake Village, CA, USA
M. F. Chang, Univ. of California, Los Angeles, Los Angeles, CA, USA
pp. 40-51
P. D. Franzon, Electr. & Comput. Eng., North Carolina State Univ., Raleigh, NC, USA
M. B. Steer, Electr. & Comput. Eng., North Carolina State Univ., Raleigh, NC, USA
Ting Zhu, Electr. & Comput. Eng., North Carolina State Univ., Raleigh, NC, USA
pp. 74-83
R. B. Staszewski, Dept. of Microelectron., Delft Univ. of Technol., Delft, Netherlands
pp. 7-18
R. Nanda, Univ. of California, Los Angeles, Los Angeles, CA, USA
D. Markovic, Univ. of California, Los Angeles, Los Angeles, CA, USA
pp. 19-26
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