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IEEE Design & Test of Computers
Dec. 2012 (vol. 29 no. 6)
ISSN: 0740-7475
Table of Contents
Papers
Dejan Markovic, University of California, Los Angeles, Los Angeles,
Rashmi Nanda, University of California, Los Angeles,
pp. 19-26
Andrew B. Kahng, Department of Computer Science and Engineering , University of California at San Diego, La Jolla,
pp. 101-102
Charles Chien, CreoNex Systems Inc., Westlake Village,
Adrian Tang, University of California, Los Angeles, Los Angeles,
Frank Hsiao, University of California, Los Angeles, Los Angeles,
Mau-Chung Frank Chang, University of California, Los Angeles, Los Angeles,
pp. 40-51
Paul D. Franzon, Electrical and Computer Engineering, North Carolina State University, Raleigh , NC, USA
Michael B. Steer, Electrical and Computer Engineering, North Carolina State University, Raleigh , NC, USA
Ting Zhu, Electrical and Computer Engineering, North Carolina State University, Raleigh ,
pp. 74-83
Theo Theocharides, Department of Electrical and Computer Engineering, University of Cyprus, 75 Kallipoleos Avenue, Nicosia, Cyprus
pp. 111-112
Huaxing Tang, Mentor Graphics Wilsonville , Oregon, USA
Kathy Yang, Mentor Graphics Wilsonville , Oregon, USA
Geir Eide, Mentor Graphics Wilsonville , Oregon, USA
Markus Seuring, Advantest Europe Böblingen , Germany
Michael Braun, Advantest Europe Böblingen , Germany
Alan Ma, Advanced Micro Devices, Inc. , Toronto, Canada
pp. 91-99
Haralampos-G. Stratigopoulos, TIMA Laboratory (CNRS-Grenoble INP-UJF), Grenoble, France
Alberto Valdes-Garcia, IBM T.J. Watson Research Center , Yorktown Heights, NY, USA
pp. 5-6
Robert Bogdan Staszewski, Dept. of Microelectronics, Delft University of Technology, Delft, The Netherlands
pp. 7-18
Gregory Creech, Ohio State University,
Len Orlando, Air Force Research Laboratory ,
Aji Mattamana, Air Force Research Laboratory ,
Jay Rockway, SPAWAR Systems Center Pacific ,
Sanjay Raman, Defense Advanced Research Projects Agency,
Kari Groves, Air Force Research Laboratory ,
Tony Quach, Air Force Research Laboratory ,
Christopher Maxey, Booz Allen Hamilton,
pp. 27-39
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