Advanced Search 
IEEE Design & Test of Computers
Oct. 2012 (vol. 29 no. 5)
ISSN: 0740-7475
Table of Contents
Papers
LeRoy Winemberg, Freescale Semiconductor, Berkeley,
Mohammad Tehranipoor, Electrical and Computer Engineering Dept., University of Connecticut, Storrs,
pp. 6-7
Theo Theocharides, Department of Electrical and Computer Engineering, University of Cyprus, 75 Kallipoleos Avenue, Nicosia, Cyprus
pp. 109-110
Venkatesh Srinivasan, Texas Instruments, Dallas, TX, USA
Yu Cao, Department of Electrical Engineering, Arizona State University, Tempe, AZ, USA
Srikanth Krishnan, Texas Instruments, Dallas, TX, USA
Min Chen, Texas Instruments, Dallas,
Vijay Reddy, Texas Instruments, Dallas, TX, USA
pp. 18-26
Daisuke Watanabe, ADVANTEST Corporation,
Masayuki Kawabata, ADVANTEST Corporation,
Tasuku Fujibe, ADVANTEST Corporation,
Kiyotaka Ichiyama, ADVANTEST Corporation,
Masahiro Ishida, ADVANTEST Corporation,
pp. 63-71
Maikel van Beurden, NXP Semiconductors, The Netherlands
Hamidreza Hashempour, NXP Semiconductors, The Netherlands
Camelia Hora, NXP Semiconductors, The Netherlands
Jos Dohmen, NXP Semiconductors, The Netherlands
Bratislav Tasic, NXP Semiconductors, The Netherlands
Bram Kruseman, High-Tech Campus 46, NXP Semiconductors, The Netherlands
Yizi Xing, NXP Semiconductors, The Netherlands
pp. 72-80
Swarup Bhunia, EECS Department, Case Western Reserve University, Cleveland, OH, USA
Xinmu Wang, EECS Department, Case Western Reserve University, Cleveland, OH, USA
Saibal Mukhopadhyay, Department of ECE, Georgia Tech, Atlanta, GA, USA
Wen Yueh, Department of ECE, Georgia Tech, Atlanta, GA, USA
Seetharam Narasimhan, EECS Department, Case Western Reserve University, Cleveland,
pp. 37-46
Sachin S. Sapatnekar, University of Minnesota, Minneapolis,
Qunzeng Liu, University of Minnesota, Minneapolis, MN, USA
Chris H. Kim, University of Minnesota, Minneapolis, MN, USA
John P. Keane, University of Minnesota , Minneapolis, MN, USA
pp. 8-17
Usage of this product signifies your acceptance of the Terms of Use.