Advanced Search 
IEEE Design & Test of Computers
Nov.-Dec. 2011 (vol. 28 no. 6)
ISSN: 0740-7475
Table of Contents
From the EIC
Guest Editors' Introduction
Jiun-Lang Huang, National Taiwan University
Kwang-Ting (Tim) Cheng, University of California, Santa Barbara
pp. 6
Flexible Electronics
Tsung-Ching Huang, University of Tokyo
Jiun-Lang Huang, National Taiwan University
Kwang-Ting (Tim) Cheng, University of California at Santa Barbara
pp. 8-15
William S. Wong, University of Waterloo
Tse Nga Ng, Palo Alto Research Center
Sanjiv Sambandan, Indian Institute of Science
Michael L. Chabinyc, University of California, Santa Barbara
pp. 16-23
Chester Liu, National Taiwan University
En-Hua Ma, National Taiwan University
Wen-En Wei, National Taiwan University
James Chien-Mo Li, National Taiwan University
I-Chun Cheng, National Taiwan University
Yung-Hui Yeh, Industrial Technology Research Institute
pp. 24-31
Yindar Chuo, Simon Fraser University
Badr Omrane, Simon Fraser University
Clint Landrock, Simon Fraser University
Jeydmer Aristizabal, Simon Fraser University
Donna Hohertz, Simon Fraser University
Sasan V. Grayli, Simon Fraser University
Bozena Kaminska, Simon Fraser University
pp. 32-40
Features
Kirk A. Gray, Accelerated Reliability Solutions
Michael Pecht, University of Maryland, College Park
pp. 58-65
Dallas L. Webster, Texas Instruments
Rick Hudgens, Texas Instruments
Donald Lie, Texas Tech University
pp. 66-75
Louay Abdallah, TIMA Laboratory
Salvador Mir, TIMA Laboratory
Christophe Kelma, NXP Semiconductors
pp. 76-84
Standards
Road Ahead
Product Futures (Abstract)
Andrew B. Kahng, University of California, San Diego
pp. 88-89
CEDA Currents
TTTC Newsletter
Conference Reports
The Last Byte
Usage of this product signifies your acceptance of the Terms of Use.