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IEEE Design & Test of Computers
September/October 2011 (vol. 28 no. 5)
ISSN: 0740-7475
Table of Contents
 | From the EIC |
 | Asynchronous Design |
 | Call for Papers |
Peter A. Beerel, University of Southern California and Fulcrum Microsystems
pp. 36-51
 | Conference Reports |
 | DAC Roundtable |
 | The Road Ahead |
 | Standards |
 | Book Reviews |
 | CEDA Currents |
 | Test Technology TC Newsletter |
 | The Last Byte |
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