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IEEE Design & Test of Computers
November/December 2010 (vol. 27 no. 6)
ISSN: 0740-7475
Table of Contents
Toc
From the EIC
Call for Papers
Guest Editors' Introduction
Postsilicon Calibration and Repair for Yield and Reliability Improvement
Vishwanath Natarajan, Georgia Institute of Technology
Shreyas Sen, Georgia Institute of Technology
Aritra Banerjee, Georgia Institute of Technology
Abhijit Chatterjee, Georgia Institute of Technology
Ganesh Srinivasan, Texas Instruments
Friedrich Taenzler, Texas Instruments
pp. 6-17
Minki Cho, Georgia Institute of Technology
Jason Schlessman, Princeton University
Hamid Mahmoodi, San Francisco State University
Marilyn Wolf, Georgia Institute of Technology
Saibal Mukhopadhyay, Georgia Institute of Technology
pp. 26-35
Rajiv Joshi, IBM Corporation,
Rouwaida Kanj, IBM, round Rock
Anthony Pelella, IBM Corporation,
Arthur tuminaro, IBM Corporation,
Yuen Chan, IBM Corporation,
pp. 36-45
Tsu-Wei Tseng, National Central University
Jin-Fu Li, National Central University
Chih-Sheng Hou, National Central University
pp. 46-57
Mohammad Al Faruque, CES:Chair for Embedded Systems , Karlsruhe
Janmartin Jahn, Karlsruhe Institute of Technology, Karlsruhe
Joerg Henkel, University of Karlsruhe, Karlsruhe
pp. 58-68
Conference Reports and Panel Summaries
Masthead
Book Reviews
CEDA Currents
DATC Newsletter
TTTC Newsletter
The Last Byte
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