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IEEE Design & Test of Computers
September/October 2010 (vol. 27 no. 5)
ISSN: 0740-7475
Table of Contents
Call for Papers
From the EIC
Masthead (Abstract)
pp. 5
Ring Oscillator Variation Analysis
Koh Johguchi, Hiroshima University
Akihiro Kaya, Hiroshima University
Shinya Izumi, Renesas Technology
Hans Mattausch, Hiroshima University
Tetsushi Koide, Hiroshima University
Norio Sadachika, Tsuneishi Shipbuilding
pp. 6-13
Physical Synthesis
David Papa, University of Michigan, Ann Arbor, and IBM Austin
Michael D. Moffitt, IBM Austin Research Lab
Charles J. Alpert, IBM Austin Research Lab
Igor L. Markov, University of Michigan , Ann Arbor
pp. 14-25
Task Mapping
Ewerson Luiz de Souza Carvalho, Pontifícia Universidade Católica do Rio Grande do Sul
Ney Laert Vilar Calazans, Pontifícia Universidade Católica do Rio Grande do Sul
Fernando Gehm Moraes, Pontifícia Universidade Católica do Rio Grande do Sul
pp. 26-35
Next-Generation Embedded Testing
Michele Portolan, Bell Labs Ireland
Suresh Goyal, Alcatel-Lucent Bell Labs
Bradford Van Treuren, Alcatel-Lucent Bell Labs
Chen-Huan Chiang, Alcatel-Lucent Bell Labs
Tapan J. Chakraborty, Alcatel-Lucent Bell Labs
Thomas B. Cook, Alcatel-Lucent Bell Labs
pp. 36-49
Failure Detection and Characterization
Alodeep Sanyal, Synopsys
Syed M. Alam, Everspin Technologies
Sandip Kundu, University of Massachusetts at Amherst
pp. 50-59
DAC 2010 Roundtable
Book Reviews
CEDA Currents
CEDA Currents (Abstract)
pp. 70-71
Conference Reports
DATC Newsletter
TTTC Newsletter
The Last Byte
The ABCs of ITC (Abstract)
Ron Press, Mentor Graphics
pp. 80
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