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IEEE Design & Test of Computers
May/June 2010 (vol. 27 no. 3)
ISSN: 0740-7475
Table of Contents
From the EIC
Masthead
Testing and Diagnosis
Mihalis Psarakis, University of Piraeus, 18534
Dimitris Gizopoulos, University of Piraeus, Piraeus
Ernesto Sanchez, Politecnico di Torino, Torino
Matteo Sonza Reorda, Politecnico di Torino, Torino
pp. 4-19
YuTsao Hsing, National Tsing Hua University, Hsinchu
LiMing Denq, National Tsing Hua University, Hsinchu
Chao-Hsun Chen, National Tsing Hua University, Hsinchu
Cheng-Wen Wu, National Tsing Hua University, Hsinchu
pp. 20-30
Chun-Yu Yang, National Tsing Hua University, Taiwan
Ying-Yen Chen, National Tsing Hua University, Taiwan
Sung-Yu Chen, National Tsing Hua University, Taiwan
Jing-Jia Liou, National Tsing Hua University, Taiwan
pp. 31-41
Pouria Bastani, University of California Santa Barbara, Santa Barbara
Nick Callegari, University of California Santa Barbara, Santa Barbara
Li-C Wang, University of California, Santa Barbara , Santa Barbara
Magdy S. Abadir, Freescale, Austin
pp. 42-53
Manish Sharma, Mentor Graphics, Wilsonville
Chris Schuermyer, Mentor Graphics, Wilsonville
Brady Benware, Mentor Graphics, Wilsonville
pp. 54-61
Perspectives
Robert Brayton, University of California, Berkeley
Jason Cong, University of California, Los Angeles
pp. 62-74
Conference Reports
Andrew B. Kahng, University of California, San Diego
pp. 86-87
TTTC Newsletter
CEDA Currents
The Last Byte
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