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IEEE Design & Test of Computers
March/April 2009 (vol. 26 no. 2)
ISSN: 0740-7475
Table of Contents
Editorial
From the EIC
Special Issue
Jean-Pierre Schoellkopf, STMicroelectronics, Crolles, France
Philippe Magarshack, STMicroelectronics, Crolles, France
pp. 20-29
Other Features
Kai-hui Chang, Avery Design Systems
David A. Papa, University of Michigan, Ann Arbor
Igor L. Markov, University of Michigan, Ann Arbor
Valeria Bertacco, University of Michigan, Ann Arbor
pp. 34-43
Li-Ming Denq, National Tsing Hua University
Yu-Tsao Hsing, National Tsing Hua University
Cheng-Wen Wu, National Tsing Hua University
pp. 64-73
DATC Newsletter
Book Review
TTTC Newsletter
CEDA Currents
The Last Byte
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