Advanced Search 
IEEE Design & Test of Computers
January/February 2009 (vol. 26 no. 1)
ISSN: 0740-7475
Table of Contents
From the EIC
Special Issue on IEEE Std 1500 and Its Usage
Laung-Terng Wang, SynTest Technologies
Ravi Apte, SynTest Technologies
Shianling Wu, SynTest Technologies
Boryau Sheu, SynTest Technologies
Kuen-Jong Lee, National Cheng Kung University
Xiaoqing Wen, Kyushu Institute of Technology
Wen-Ben Jone, University of Cincinnati
Jianghao Guo, University of Cincinnati
Wei-Shin Wang, Silicon Integrated Systems
Hao-Jan Chao, SynTest Technologies
Jinsong Liu, SynTest Technologies
Yanlong Niu, SynTest Technologies
Yi-Chih Sung, SynTest Technologies
Chi-Chun Wang, SynTest Technologies
Fangfang Li, SynTest Technologies
pp. 26-35
Rohit Kapur, Synopsys
Paul Reuter, Mentor Graphics
Sandeep Bhatia, Cadence Design Systems
Brion Keller, Cadence Design Systems
pp. 36-43
Fault Detection
Crossbar-Based Nanoarchitectures
Wenjing Rao, University of Illinois at Chicago
Alex Orailoglu, University of California, San Diego
Ramesh Karri, Polytechnic University of NYU
pp. 68-77
Resizing for Design Reuse
Timothée Levi, LIMMS, University of Tokyo
Jean Tomas, Bordeaux University
Noëlle Lewis, Bordeaux University
Pascal Fouillat, Ecole Nationale Supérieure d'Electronique de Bordeaux
pp. 78-87
Perspectives
CEDA Currents
Book Reviews
Test Technology Newsletter
The Last Byte
Usage of this product signifies your acceptance of the Terms of Use.