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IEEE Design & Test of Computers
November-December 2008 (vol. 25 no. 6)
ISSN: 0740-7475
Table of Contents
High-Performance Switches
Call for Papers
David Kung, (IBM Research)
Yuan Xie, (Pennsylvania State University)
pp. 505
From the EIC
Wafer-Level Test
Mohammad Tehranipoor, University of Connecticut, Storrs
Reza M.P. Rad, University of Maryland, Baltimore County
pp. 549-559
Test Time Reduction
Jen-Chieh Yeh, Industrial Technology Research Institute
Shuo-Fen Kuo, Realtek Semiconductor
Chao-Hsun Chen, National Tsing Hua University
Cheng-Wen Wu, National Tsing Hua University
pp. 560-570
Globally Asynchronous, Locally Synchronous Design
Abbas Sheibanyrad, TIMA Laboratory
Alain Greiner, Laboratoire d'Informatique de Paris 6
Ivan Miro-Panades, French Atomic Energy Commission, Grenoble
pp. 572-580
Stefan Valentin Gheorghita, Google Switzerland
Twan Basten, Eindhoven University of Technology
Henk Corporaal, Eindhoven University of Technology
pp. 581-589
Embedded Systems
Ted Huffmire, Naval Postgraduate School
Brett Brotherton, Special Technologies Laboratory
Timothy Sherwood, University of California, Santa Barbara
Ryan Kastner, University of California, San Diego
Timothy Levin, Naval Postgraduate School
Thuy D. Nguyen, Naval Postgraduate School
Cynthia Irvine, Naval Postgraduate School
pp. 590-598
Design Automation Technical Committee Newsletter
Book Reviews
Test Technology TC Newsletter
CEDA Currents
The Last Byte
Annual Index
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