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IEEE Design & Test of Computers
September-October 2008 (vol. 25 no. 5)
ISSN: 0740-7475
Table of Contents
In-Circuit Emulation
Call for Papers
Philippe Coussy, (UEB-UBS University, LabSTICC)
Andres Takach, (Mentor Graphics)
pp. 393
From the EIC
Staff Listing
Perspectives
ITC 2008 Highlights (Abstract)
Nur A. Touba, University of Texas at Austin
pp. 398-399
Design and Test of Interconnects for Multicore Chips
Alessandro Pinto, University of California, Berkeley
Luca P. Carloni, Columbia University
Alberto Sangiovanni-Vincentelli, University of California, Berkeley
pp. 402-415
Byungsub Kim, Massachusetts Institute of Technology
Vladimir Stojanović, Massachusetts Institute of Technology
pp. 430-439
Matthias Kühnle, University of Karlsruhe
Michael Hübner, University of Karlsruhe
Jürgen Becker, University of Karlsruhe
Antonio Deledda, University of Bologna
Claudio Mucci, University of Bologna
Florian Ries, University of Bologna
Antonio Marcello Coppola, STMicroelectronics
Lorenzo Pieralisi, STMicroelectronics
Riccardo Locatelli, STMicroelectronics
Giuseppe Maruccia, STMicroelectronics
Tommaso DeMarco, STMicroelectronics
Fabio Campi, STMicroelectronics
pp. 442-451
Enhancing Signal Integrity
Jorge Filipe L.C. Semião, University of Algarve
Marcial Jesús Rodríguez Irago, University of Vigo
Juan J. Rodríguez-Andina, University of Vigo
Leonardo Bisch Piccoli, Pontific Catholic University of Rio Grande do Sul
Fabian Luis Vargas, Pontific Catholic University of Rio Grande do Sul
João Paulo Teixeira, INESC-ID, IST
pp. 452-461
Functional Verification
Geeng-Wei Lee, National Chiao Tung University
Juinn-Dar Huang, National Chiao Tung University
Chun-Yao Wang, National Tsing Hua University
Jing-Yang Jou, National Chiao Tung University
pp. 478-486
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