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IEEE Design & Test of Computers
July-August 2008 (vol. 25 no. 4)
ISSN: 0740-7475
Table of Contents
From the EIC
Special Issue Features
Jan M. Rabaey, University of California, Berkeley
Sharad Malik, Princeton University
pp. 296-302
Wen-mei Hwu, University of Illinois at Urbana-Champaign
Kurt Keutzer, University of California, Berkeley
pp. 312-320
Todd Austin, University of Michigan, Ann Arbor
Valeria Bertacco, University of Michigan, Ann Arbor
Scott Mahlke, University of Michigan, Ann Arbor
Yu Cao, Arizona State University, Tempe
pp. 322-332
Naresh R. Shanbhag, University of Illinois at Urbana-Champaign
Subhasish Mitra, Stanford University
Gustavode de Veciana, University of Texas at Austin
Michael Orshansky, University of Texas at Austin
Radu Marculescu, Carnegie Mellon University
Jaijeet Roychowdhury, University of Minnesota
Douglas Jones, University of Illinois at Urbana-Champaign
Jan M. Rabaey, University of California, Berkeley
pp. 334-343
Jan M. Rabaey, University of California, Berkeley
Daniel Burke, University of California, Berkeley
Ken Lutz, University of California, Berkeley
John Wawrzynek, University of California, Berkeley
pp. 358-365
Other Features
Book Reviews
DATC Newsletter
CEDA Currents
TTTC Newsletter
The Last Byte
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