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IEEE Design & Test of Computers
May-June 2008 (vol. 25 no. 3)
ISSN: 0740-7475
Table of Contents
 | From the EIC |
 | Special Issue Features |
Li-C. Wang, University of California, Santa Barbara
pp. 232-239
 | Roundtable |
Wen-mei Hwu, University of Illinois at Urbana-Champaign
pp. 272-278
 | DATC Newsletter |
 | CEDA Currents |
 | Book Reviews |
 | TTTC Newsletter |
 | The Last Byte |
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