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IEEE Design & Test of Computers
May-June 2008 (vol. 25 no. 3)
ISSN: 0740-7475
Table of Contents
From the EIC
Special Issue Features
Pouria Bastani, University of California, Santa Barbara
Li-C. Wang, University of California, Santa Barbara
Magdy S. Abadir, Freescale Semiconductor
pp. 232-239
Yu Huang, Mentor Graphics
Ruifeng Guo, Mentor Graphics
Wu-Tung Cheng, Mentor Graphics
James Chien-Mo Li, National Taiwan University
pp. 240-248
Christian Boit, Berlin University of Technology
Rudolf Schlangen, Berlin University of Technology
Uwe Kerst, Berlin University of Technology
Ted Lundquist, DCG Systems
pp. 250-257
Thousand-Core Chips (Abstract)
David Yeh, Texas Instruments
Li-Shiuan Peh, Princeton University
Anant Agarwal, Massachusetts Institute of Technology and Tilera
Wen-mei Hwu, University of Illinois at Urbana-Champaign
pp. 272-278
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