Advanced Search 
IEEE Design & Test of Computers
March-April 2008 (vol. 25 no. 2)
ISSN: 0740-7475
Table of Contents
From the EIC
Special Issue Features
Laung-Terng Wang, SynTest Technologies
Xiaoqing Wen, Kyushu Institute of Technology
Shianling Wu, SynTest Technologies
Zhigang Wang, Cisco Systems
Zhigang Jiang, SynTest Technologies
Boryau Sheu, SynTest Technologies
Xinli Gu, Cisco Systems
pp. 122-130
RFIC Chips, Part 2
Other Features
DATC Newsletter
Interview
Standards
Book Reviews
CEDA Currents
TTTC Newsletter
The Last Byte
Usage of this product signifies your acceptance of the Terms of Use.