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IEEE Design & Test of Computers
March-April 2008 (vol. 25 no. 2)
ISSN: 0740-7475
Table of Contents
 | From the EIC |
| Special Issue Features |
| RFIC Chips, Part 2 |
| Other Features |
| DATC Newsletter |
| Interview |
| Standards |
| Book Reviews |
| CEDA Currents |
| TTTC Newsletter |
| The Last Byte |
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