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IEEE Design & Test of Computers
January-February 2008 (vol. 25 no. 1)
ISSN: 0740-7475
Table of Contents
Special Issue Features
From the EIC
Changwook Yoon, Korea Advanced Institute of Science and Technology
Junwoo Lee, Hynix Semiconductor
Young-Jin Park, Korea Electrotechnology Research Institute
Hyunjeong Park, Korea Advanced Institute of Science and Technology
Jaemin Kim, Korea Advanced Institute of Science and Technology
Jun So Pak, Korea Advanced Institute of Science and Technology
Joungho Kim, Korea Advanced Institute of Science and Technology
pp. 18-28
Yves Joannon, Grenoble Institute of Technology
Vincent Beroulle, Grenoble Institute of Technology
Chantal Robach, Grenoble Institute of Technology
Smail Tedjini, Grenoble Institute of Technology
Jean-Louis Carbonéro, STMicroelectronics
pp. 29-37
Other Features
Nektarios Kranitis, University of Athens
Andreas Merentitis, University of Athens
George Theodorou, University of Athens
Antonis Paschalis, University of Athens
Dimitris Gizopoulos, University of Piraeus
pp. 64-75
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DATC Newsletter
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