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| Sachin Sapatnekar, Leon Stok, "DAC Highlights," IEEE Design & Test of Computers, vol. 24, no. 5, pp. 502-504, September-October, 2007. | |||
| BibTex | x | ||
| @article{ 10.1109/MDT.2007.160, author = {Sachin Sapatnekar and Leon Stok}, title = {DAC Highlights}, journal ={IEEE Design & Test of Computers}, volume = {24}, number = {5}, issn = {0740-7475}, year = {2007}, pages = {502-504}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2007.160}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - IEEE Design & Test of Computers TI - DAC Highlights IS - 5 SN - 0740-7475 SP502 EP504 EPD - 502-504 A1 - Sachin Sapatnekar, A1 - Leon Stok, PY - 2007 KW - Design Automation Conference KW - DAC KW - electronic design automation KW - automotive electronics KW - semiconductor industry VL - 24 JA - IEEE Design & Test of Computers ER - | |||
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2007.160
The 44th Design Automation Conference (DAC) was held on 4-8 June 2007 in San Diego, California, and brought together design engineers, managers, developers, and researchers from industry and academia. This report provides a short summary of the technical trends in this premier event on electronic design automation and silicon solutions.
Index Terms:
Design Automation Conference, DAC, electronic design automation, automotive electronics, semiconductor industry
Citation:
Sachin Sapatnekar, Leon Stok, "DAC Highlights," IEEE Design & Test of Computers, vol. 24, no. 5, pp. 502-504, Sept.-Oct. 2007, doi:10.1109/MDT.2007.160
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