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| Jerzy Tyszer, Janusz Rajski, Grzegorz Mrugalski, Nilanjan Mukherjee, Mark Kassab, Wu-Tung Cheng, Manish Sharma, Liyang Lai, "X-Tolerant Compactor with On-Chip Registration and Signature-Based Diagnosis," IEEE Design & Test of Computers, vol. 24, no. 5, pp. 476-485, September-October, 2007. | |||
| BibTex | x | ||
| @article{ 10.1109/MDT.2007.177, author = {Jerzy Tyszer and Janusz Rajski and Grzegorz Mrugalski and Nilanjan Mukherjee and Mark Kassab and Wu-Tung Cheng and Manish Sharma and Liyang Lai}, title = {X-Tolerant Compactor with On-Chip Registration and Signature-Based Diagnosis}, journal ={IEEE Design & Test of Computers}, volume = {24}, number = {5}, issn = {0740-7475}, year = {2007}, pages = {476-485}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2007.177}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - IEEE Design & Test of Computers TI - X-Tolerant Compactor with On-Chip Registration and Signature-Based Diagnosis IS - 5 SN - 0740-7475 SP476 EP485 EPD - 476-485 A1 - Jerzy Tyszer, A1 - Janusz Rajski, A1 - Grzegorz Mrugalski, A1 - Nilanjan Mukherjee, A1 - Mark Kassab, A1 - Wu-Tung Cheng, A1 - Manish Sharma, A1 - Liyang Lai, PY - 2007 KW - DFT KW - embedded test KW - fault diagnosis KW - on-chip collection of test data KW - scan-based designs KW - selective compaction of test responses VL - 24 JA - IEEE Design & Test of Computers ER - | |||
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