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IEEE Design & Test of Computers
March-April 2007 (vol. 24 no. 2)
ISSN: 0740-7475
Table of Contents
From the EIC
Advances in Functional Validation through Hybrid Techniques
Jayanta Bhadra, Freescale Semiconductor
Magdy S. Abadir, Freescale Semiconductor
Li-C. Wang, University of California, Santa Barbara
pp. 110-111
Jayanta Bhadra, Freescale Semiconductor
Magdy S. Abadir, Freescale Semiconductor
Li-C. Wang, University of California, Santa Barbara
Sandip Ray, University of Texas at Austin
pp. 112-122
Nicola Bombieri, University of Verona
Franco Fummi, University of Verona
Graziano Pravadelli, University of Verona
Andrea Fedeli, STMicroelectronics
pp. 140-152
Chin-Lung Chuang, National Central University
Wei-Hsiang Cheng, National Central University
Dong-Jung Lu, AU Optronics
Chien-Nan Jimmy Liu, National Central University
pp. 154-162
Built-in Self-Repair
Rei-Fu Huang, Media Tek
Chao-Hsun Chen, National Tsing Hua University
Cheng-Wen Wu, National Tsing Hua University
pp. 164-172
Roundtable
Markus Levy, The Multicore Association and EEMBC
Masao Nakaya, Renesas Technology
Pierre Paulin, STMicroelectronics
Ulrich Ramacher, Infineon Technologies
Deepu Talla, Texas Instruments
Wayne Wolf, Princeton University
pp. 174-183
Perspectives
Departments
Conference Reports (Abstract)
C.P. Ravikumar, Texas Instruments
Jari Nurmi, Tampere University of Technology
pp. 202-203
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