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| Bruce C. Kim, "Test Technology TC Newsletter," IEEE Design & Test of Computers, vol. 24, no. 2, pp. 197, March-April, 2007. | |||
| BibTex | x | ||
| @article{ 10.1109/MDT.2007.58, author = {Bruce C. Kim}, title = {Test Technology TC Newsletter}, journal ={IEEE Design & Test of Computers}, volume = {24}, number = {2}, issn = {0740-7475}, year = {2007}, pages = {197}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2007.58}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - IEEE Design & Test of Computers TI - Test Technology TC Newsletter IS - 2 SN - 0740-7475 SP EP EPD - 197 A1 - Bruce C. Kim, PY - 2007 KW - TTTC KW - test technology KW - SWTW 07 KW - IMSTW 07 KW - GTW 07 VL - 24 JA - IEEE Design & Test of Computers ER - | |||
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2007.58
This newsletter provides information on past and upcoming events related to the IEEE Computer Society's Test Technology Technical Council and the test community.
Index Terms:
TTTC, test technology, SWTW 07, IMSTW 07, GTW 07
Citation:
Bruce C. Kim, "Test Technology TC Newsletter," IEEE Design & Test of Computers, vol. 24, no. 2, pp. 197, March-April 2007, doi:10.1109/MDT.2007.58
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