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ITC 2006 panels
January-February 2007 (vol. 24 no. 1)
pp. 94-96
| ASCII Text | x | ||
| Carol Stolicny, "ITC 2006 panels," IEEE Design & Test of Computers, vol. 24, no. 1, pp. 94-96, January-February, 2007. | |||
| BibTex | x | ||
| @article{ 10.1109/MDT.2007.20, author = {Carol Stolicny}, title = {ITC 2006 panels}, journal ={IEEE Design & Test of Computers}, volume = {24}, number = {1}, issn = {0740-7475}, year = {2007}, pages = {94-96}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2007.20}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - IEEE Design & Test of Computers TI - ITC 2006 panels IS - 1 SN - 0740-7475 SP94 EP96 EPD - 94-96 A1 - Carol Stolicny, PY - 2007 KW - ITC KW - International Test Conference VL - 24 JA - IEEE Design & Test of Computers ER - | |||
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2007.20
The International Test Conference technical program has long included panel sessions that provide an informal, entertaining opportunity for ITC audiences to engage in discussion and debates with industry and research experts on a wide range of subjects. This tradition continued in a new venue in 2006 with an intriguing slate of panel sessions. In this column, the ITC 2006 panel organizers capture the deliberations and results from their respective panels for D&T readers who may not have had the opportunity to attend the conference or perhaps attended different, parallel panel discussions.
Index Terms:
ITC, International Test Conference
Citation:
Carol Stolicny, "ITC 2006 panels," IEEE Design & Test of Computers, vol. 24, no. 1, pp. 94-96, Jan.-Feb. 2007, doi:10.1109/MDT.2007.20
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