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| Hans G. Kerkhoff, "Testing Microelectronic Biofluidic Systems," IEEE Design & Test of Computers, vol. 24, no. 1, pp. 72-82, January-February, 2007. | |||
| BibTex | x | ||
| @article{ 10.1109/MDT.2007.28, author = {Hans G. Kerkhoff}, title = {Testing Microelectronic Biofluidic Systems}, journal ={IEEE Design & Test of Computers}, volume = {24}, number = {1}, issn = {0740-7475}, year = {2007}, pages = {72-82}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2007.28}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - IEEE Design & Test of Computers TI - Testing Microelectronic Biofluidic Systems IS - 1 SN - 0740-7475 SP72 EP82 EPD - 72-82 A1 - Hans G. Kerkhoff, PY - 2007 KW - microelectronic fluidic arrays KW - flowFET KW - defect-oriented testing KW - analog microfluidics KW - digital microfluidics VL - 24 JA - IEEE Design & Test of Computers ER - | |||
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2007.28
According to the 2005 International Technology Roadmap for Semiconductors, the integration of emerging nondigital CMOS technologies will require radically different test methods, posing a major challenge for designers and test engineers. One such technology is microelectronic fluidic (MEF) arrays, which have rapidly gained importance in many biological, pharmaceutical, and industrial applications. The advantages of these systems, such as operation speed, use of very small amounts of liquid, on-board droplet detection, signal conditioning, and vast digital signal processing, make them very promising. However, testable design of these devices in a mass-production environment is still in its infancy, hampering their low-cost introduction to the market. This article describes analog and digital MEF design and testing methods.
Index Terms:
microelectronic fluidic arrays, flowFET, defect-oriented testing, analog microfluidics, digital microfluidics
Citation:
Hans G. Kerkhoff, "Testing Microelectronic Biofluidic Systems," IEEE Design & Test of Computers, vol. 24, no. 1, pp. 72-82, Jan.-Feb. 2007, doi:10.1109/MDT.2007.28
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