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IEEE Design & Test of Computers
July/August 2006 (vol. 23 no. 4)
ISSN: 0740-7475
Table of Contents
On-Chip Testing
From the EIC
Conference Reports
Jim Plusquellic, University of Maryland, Baltimore
Dhruva Acharyya, University of Maryland, Baltimore
Abhishek Singh, University of Maryland, Baltimore
Mohammad Tehranipoor, University of Maryland, Baltimore
Chintan Patel, University of Maryland, Baltimore
pp. 278-293
Departments
The Last Byte
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