Advanced Search 
IEEE Design & Test of Computers
May/June 2006 (vol. 23 no. 3)
ISSN: 0740-7475
Table of Contents
From the EIC
DAC Watch
Sachin Sapatnekar, University of Minnesota
Grant Martin, Tensilica
pp. 182-184
Conference Reports
System-in-Package Design and Test
Davide Appello, STMicroelectronics
Paolo Bernardi, Politecnico di Torino
Michelangelo Grosso, Politecnico di Torino
Matteo Sonza Reorda, Politecnico di Torino
pp. 203-211
Dong Gun Kam, Korea Advanced Institute of Science and Technology
Joungho Kim, Korea Advanced Institute of Science and Technology
Jiheon Yu, Amkor Technology Korea
Ho Choi, Amkor Technology Korea
Kicheol Bae, Amkor Technology Korea
Choonheung Lee, Amkor Technology Korea
pp. 212-219
Book Reviews
Departments
The Last Byte
Usage of this product signifies your acceptance of the Terms of Use.