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IEEE Design & Test of Computers
January/February 2006 (vol. 23 no. 1)
ISSN: 0740-7475
Table of Contents
EIC Message
Features
Bernhard Peischl, Technische Universitat Graz Institute for Software Technology (IST)
Franz Wotawa, Technische Universitat Graz Institute for Software Technology (IST)
pp. 8-19
Hamilton Klimach, Federal University of Rio Grande do Sul
Carlos Galup-Montoro, Federal University of Santa Catarina
M?rcio C. Schneider, Federal University of Santa Catarina
Alfredo Arnaud, Catholic University of Uruguay
pp. 20-29
Kevin Lucas, Freescale Semiconductor
Chi-Min Yuan, Freescale Semiconductor
Robert Boone, Freescale Semiconductor
Karl Wimmer, Freescale Semiconductor
Kirk Strozewski, Freescale Semiconductor
Olivier Toublan, Mentor Graphics Europe
pp. 30-37
Julio P?rez, Universidad de la Republica, Montevideo, Uruguay
Matteo Sonza Reorda, Politecnico di Torino
Massimo Violante, Politecnico di Torino
pp. 38-45
Antonio Petraglia, Federal University of Rio de Janeiro
Jorge M. Ca?ive, Federal University of Rio de Janeiro
Mariane R. Petraglia, Federal University of Rio de Janeiro
pp. 58-66
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