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IEEE Design & Test of Computers
November/December 2005 (vol. 22 no. 6)
ISSN: 0740-7475
Table of Contents
From the EIC
Rajesh Gupta, Editor in Chief, IEEE Design & Test
pp. 493-494
W. Rhett Davis, North Carolina State University
John Wilson, North Carolina State University
Stephen Mick, North Carolina State University
Jian Xu, North Carolina State University
Hao Hua, North Carolina State University
Christopher Mineo, North Carolina State University
Ambarish M. Sule, North Carolina State University
Michael Steer, North Carolina State University
Paul D. Franzon, North Carolina State University
pp. 498-510
Peter Benkart, Infineon Technologies and University of Ulm
Alexander Kaiser, University of Ulm
Andreas Munding, University of Ulm
Markus Bschorr, University of Ulm
Hans-Joerg Pfleiderer, University of Ulm
Erhard Kohn, University of Ulm
Arne Heittmann, Infineon Technologies
Holger Huebner, Infineon Technologies
Ulrich Ramacher, Infineon Technologies
pp. 512-518
Cristinel Ababei, University of Minnesota
Yan Feng, University of Minnesota
Brent Goplen, University of Minnesota
Hushrav Mogal, University of Minnesota
Tianpei Zhang, University of Minnesota
Kia Bazargan, University of Minnesota
Sachin Sapatnekar, University of Minnesota
pp. 520-531
Philip Jacob, Rensselaer Polytechnic Institute
Okan Erdogan, Rensselaer Polytechnic Institute
Aamir Zia, Rensselaer Polytechnic Institute
Paul M. Belemjian, Rensselaer Polytechnic Institute
Russell P. Kraft, Rensselaer Polytechnic Institute
John F. McDonald, Rensselaer Polytechnic Institute
pp. 540-547
Annie (Yujuan) Zeng, Rensselaer Polytechnic Institute
James (JianQiang) L?, Rensselaer Polytechnic Institute
Kenneth Rose, Rensselaer Polytechnic Institute
Ronald J. Gutmann, Rensselaer Polytechnic Institute
pp. 548-555
Special ITC Section
Steven S. Lumetta, University of Illinois at Urbana-Champaign
Michael Mitzenmacher, Harvard University
pp. 566-574
Xiao Liu, Texas Instruments
Michael S. Hsiao, Virginia Polytechnic Institute and State University
pp. 576-584
Book Reviews
Panel Summaries
Conference Reports
Vladimir Hahanov, Kharkov National University of Radioelectronics
pp. 600
TTTC Newsletter
Annual Index
The Last Byte
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