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IEEE Design & Test of Computers
July/August 2005 (vol. 22 no. 4)
ISSN: 0740-7475
Table of Contents
From the EIC
Special Announcement
Giovanni De Micheli, IEEE Council for Electronic Design Automation
Al Dunlop, IEEE Council for Electronic Design Automation
pp. 293-294
Features
Darshan D. Thaker, University of California, Davis
Francois Impens, Massachusetts Institute of Technology
Isaac L. Chuang, Massachusetts Institute of Technology
Rajeevan Amirtharajah, University of California, Davis
Frederic T. Chong, University of California, Santa Barbara
pp. 298-305
Andr? DeHon, California Institute of Technology
Helia Naeimi, California Institute of Technology
pp. 306-315
Chen He, University of Texas at Austin and Freescale Semiconductor Inc.
Margarida F. Jacome, University of Texas at Austin
Gustavo de Veciana, University of Texas at Austin
pp. 316-326
Jie Han, University of Florida
Jianbo Gao, University of Florida
Yan Qi, Johns Hopkins University
Pieter Jonker, Delft University of Technology
Jos? A.B. Fortes, University of Florida
pp. 328-339
Special Features
Daniele Rossi, University of Bologna
Andr? K. Nieuwland, Philips Research Laboratories
Atul Katoch, Philips Research Laboratories
Cecilia Metra, University of Bologna
pp. 340-348
Mark L. Chang, Franklin W. Olin College of Engineering
Scott Hauck, University of Washington
pp. 349-361
Chong Zhao, University of California, San Diego
Sujit Dey, University of California, San Diego
Xiaoliang Bai, Cadence Design Systems
pp. 362-375
Rajeev R. Rao, University of Michigan, Ann Arbor
David Blaauw, University of Michigan, Ann Arbor
Dennis Sylvester, University of Michigan, Ann Arbor
Anirudh Devgan, Magma Design Automation
pp. 376-385
Book Reviews
Scott Davidson, Sun Microsystems
pp. 386-387
Panel Summaries
Conference Reports
DATC Newsletter
The Last Byte
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